About the existing discrepancy in the determinations of the Avogadro constant

被引:23
作者
Martin, J [1 ]
Bettin, H [1 ]
Kuetgens, U [1 ]
Schiel, D [1 ]
Becker, P [1 ]
机构
[1] Phys Tech Bundesanstalt, D-38116 Braunschweig, Germany
关键词
Avogadro constant; density; flotation measurement; impurities; lattice spacing comparison; positron annihilation; selfpoint defects; silicon (single crystal); voids;
D O I
10.1109/19.769567
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The values for the Avogadro constant N-A, derived from lattice spacing, density, and molar mass of silicon single crystals at several metrological institutes, show significant differences. To illuminate this discrepancy, comparison measurements of lattice spacing and density were performed. Positron annihilation measurements were used to estimate the vacancy concentration in Si samples. All crystals lead to nearly the same lattice spacing after correction for the influence of carbon and oxygen impurities. It is proved that the discrepancy in the determinations of the Avogadro constant cannot be explained by vacancies or interstitials. Also indications for macroscopic bubbles or cavities could not be found.
引用
收藏
页码:216 / 220
页数:5
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