Monolithic integration of a SiGe/Si modulator and multiple quantum well photodetector for 1.55 μm operation

被引:15
作者
Li, BJ [1 ]
Li, GZ
Liu, EK
Jiang, ZM
Qin, J
Wang, X
机构
[1] Fudan Univ, Surface Phys Lab, Shanghai 200433, Peoples R China
[2] Xian Jiao Tong Univ, Dept Microelect Engn, Xian 710049, Shaanxi, Peoples R China
关键词
D O I
10.1063/1.122818
中图分类号
O59 [应用物理学];
学科分类号
摘要
The monolithic integration of a SiGe/Si rib waveguide modulator and multiple quantum well photodetector prepared by molecular beam epitaxy is achieved. The low dark current of 49.8 nA at -5 V reverse bias is measured and a modulation depth of 90% at 2.8 V modulation bias is obtained. The external quantum efficiency at lambda = 1.55 mu m is estimated to be 18.2%. (C) 1998 American Institute of Physics. [S0003-6951(98)02550-9].
引用
收藏
页码:3504 / 3505
页数:2
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