共 21 条
Distance control for a near-field scanning microwave microscope in liquid using a quartz tuning fork
被引:24
作者:

Kim, S
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机构: Sogang Univ, Dept Phys, Seoul 121742, South Korea

Yoo, H
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h-index: 0
机构: Sogang Univ, Dept Phys, Seoul 121742, South Korea

Lee, K
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h-index: 0
机构: Sogang Univ, Dept Phys, Seoul 121742, South Korea

Friedman, B
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h-index: 0
机构: Sogang Univ, Dept Phys, Seoul 121742, South Korea

Gaspar, MA
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机构: Sogang Univ, Dept Phys, Seoul 121742, South Korea

Levicky, R
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机构: Sogang Univ, Dept Phys, Seoul 121742, South Korea
机构:
[1] Sogang Univ, Dept Phys, Seoul 121742, South Korea
[2] Sogang Univ, Interdisciplinary Program Integrated Biotechnol, Seoul 121742, South Korea
[3] Sam Houston State Univ, Dept Phys, Huntsville, TX 77341 USA
[4] Columbia Univ, Dept Chem Engn, New York, NY 10027 USA
基金:
美国国家科学基金会;
新加坡国家研究基金会;
关键词:
D O I:
10.1063/1.1904713
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
We demonstrate a scanning near-field microwave microscope (NSMM) in the liquid environment using a tuning fork shear-force feedback method to control the distance between tip and sample. Only the probe tip for the NSMM is immersed in water. The dry part of the probe is attached to one prong of a quartz tuning fork and directly coupled to a high-quality dielectric resonator at an operating frequency f=4.5-5.5 GHz. This distance control method is independent of the local microwave characteristics. The amplitude of the tuning fork was used as a set point of the distance control parameter in the liquid. To demonstrate the distance regulation system, we present the NSMM images of a copper film in air and liquid without and with readjustment of the distance set point, as well as an image of a DNA film in buffer solution. Imaging under buffer environments is of particular interest for future studies of biomolecular association reactions on solid supports. (C) 2005 American Institute of Physics.
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页数:3
相关论文
共 21 条
[1]
Near-field scanning microwave probe based on a dielectric resonator
[J].
Abu-Teir, M
;
Golosovsky, M
;
Davidov, D
;
Frenkel, A
;
Goldberger, H
.
REVIEW OF SCIENTIFIC INSTRUMENTS,
2001, 72 (04)
:2073-2079

Abu-Teir, M
论文数: 0 引用数: 0
h-index: 0
机构:
Hebrew Univ Jerusalem, Racah Inst Phys, IL-91904 Jerusalem, Israel Hebrew Univ Jerusalem, Racah Inst Phys, IL-91904 Jerusalem, Israel

Golosovsky, M
论文数: 0 引用数: 0
h-index: 0
机构: Hebrew Univ Jerusalem, Racah Inst Phys, IL-91904 Jerusalem, Israel

Davidov, D
论文数: 0 引用数: 0
h-index: 0
机构: Hebrew Univ Jerusalem, Racah Inst Phys, IL-91904 Jerusalem, Israel

Frenkel, A
论文数: 0 引用数: 0
h-index: 0
机构: Hebrew Univ Jerusalem, Racah Inst Phys, IL-91904 Jerusalem, Israel

Goldberger, H
论文数: 0 引用数: 0
h-index: 0
机构: Hebrew Univ Jerusalem, Racah Inst Phys, IL-91904 Jerusalem, Israel
[2]
Experimental demonstration for scanning near-field optical microscopy using a metal micro-slit probe at millimeter wavelengths
[J].
Bae, J
;
Okamoto, T
;
Fujii, T
;
Mizuno, K
;
Nozokido, T
.
APPLIED PHYSICS LETTERS,
1997, 71 (24)
:3581-3583

Bae, J
论文数: 0 引用数: 0
h-index: 0
机构:
INST PHYS & CHEM RES,PHOTODYNAM RES CTR,AOBA KU,SENDAI,MIYAGI 980,JAPAN INST PHYS & CHEM RES,PHOTODYNAM RES CTR,AOBA KU,SENDAI,MIYAGI 980,JAPAN

Okamoto, T
论文数: 0 引用数: 0
h-index: 0
机构:
INST PHYS & CHEM RES,PHOTODYNAM RES CTR,AOBA KU,SENDAI,MIYAGI 980,JAPAN INST PHYS & CHEM RES,PHOTODYNAM RES CTR,AOBA KU,SENDAI,MIYAGI 980,JAPAN

Fujii, T
论文数: 0 引用数: 0
h-index: 0
机构:
INST PHYS & CHEM RES,PHOTODYNAM RES CTR,AOBA KU,SENDAI,MIYAGI 980,JAPAN INST PHYS & CHEM RES,PHOTODYNAM RES CTR,AOBA KU,SENDAI,MIYAGI 980,JAPAN

Mizuno, K
论文数: 0 引用数: 0
h-index: 0
机构:
INST PHYS & CHEM RES,PHOTODYNAM RES CTR,AOBA KU,SENDAI,MIYAGI 980,JAPAN INST PHYS & CHEM RES,PHOTODYNAM RES CTR,AOBA KU,SENDAI,MIYAGI 980,JAPAN

Nozokido, T
论文数: 0 引用数: 0
h-index: 0
机构:
INST PHYS & CHEM RES,PHOTODYNAM RES CTR,AOBA KU,SENDAI,MIYAGI 980,JAPAN INST PHYS & CHEM RES,PHOTODYNAM RES CTR,AOBA KU,SENDAI,MIYAGI 980,JAPAN
[3]
COMBINED SHEAR FORCE AND NEAR-FIELD SCANNING OPTICAL MICROSCOPY
[J].
BETZIG, E
;
FINN, PL
;
WEINER, JS
.
APPLIED PHYSICS LETTERS,
1992, 60 (20)
:2484-2486

BETZIG, E
论文数: 0 引用数: 0
h-index: 0
机构: AT and T Bell Laboratories, Murray Hill, NJ 07974

FINN, PL
论文数: 0 引用数: 0
h-index: 0
机构: AT and T Bell Laboratories, Murray Hill, NJ 07974

WEINER, JS
论文数: 0 引用数: 0
h-index: 0
机构: AT and T Bell Laboratories, Murray Hill, NJ 07974
[4]
Scanning nonlinear dielectric microscopy with nanometer resolution
[J].
Cho, Y
;
Kazuta, S
;
Matsuura, K
.
APPLIED PHYSICS LETTERS,
1999, 75 (18)
:2833-2835

Cho, Y
论文数: 0 引用数: 0
h-index: 0
机构:
Tohoku Univ, Elect Commun Res Inst, Aoba Ku, Sendai, Miyagi 9808577, Japan Tohoku Univ, Elect Commun Res Inst, Aoba Ku, Sendai, Miyagi 9808577, Japan

Kazuta, S
论文数: 0 引用数: 0
h-index: 0
机构:
Tohoku Univ, Elect Commun Res Inst, Aoba Ku, Sendai, Miyagi 9808577, Japan Tohoku Univ, Elect Commun Res Inst, Aoba Ku, Sendai, Miyagi 9808577, Japan

Matsuura, K
论文数: 0 引用数: 0
h-index: 0
机构:
Tohoku Univ, Elect Commun Res Inst, Aoba Ku, Sendai, Miyagi 9808577, Japan Tohoku Univ, Elect Commun Res Inst, Aoba Ku, Sendai, Miyagi 9808577, Japan
[5]
Imaging microwave electric fields using a near-field scanning microwave microscope
[J].
Dutta, SK
;
Vlahacos, CP
;
Steinhauer, DE
;
Thanawalla, AS
;
Feenstra, BJ
;
Wellstood, FC
;
Anlage, SM
;
Newman, HS
.
APPLIED PHYSICS LETTERS,
1999, 74 (01)
:156-158

Dutta, SK
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Maryland, Ctr Superconduct Res, Dept Phys, College Pk, MD 20742 USA Univ Maryland, Ctr Superconduct Res, Dept Phys, College Pk, MD 20742 USA

Vlahacos, CP
论文数: 0 引用数: 0
h-index: 0
机构: Univ Maryland, Ctr Superconduct Res, Dept Phys, College Pk, MD 20742 USA

Steinhauer, DE
论文数: 0 引用数: 0
h-index: 0
机构: Univ Maryland, Ctr Superconduct Res, Dept Phys, College Pk, MD 20742 USA

Thanawalla, AS
论文数: 0 引用数: 0
h-index: 0
机构: Univ Maryland, Ctr Superconduct Res, Dept Phys, College Pk, MD 20742 USA

Feenstra, BJ
论文数: 0 引用数: 0
h-index: 0
机构: Univ Maryland, Ctr Superconduct Res, Dept Phys, College Pk, MD 20742 USA

Wellstood, FC
论文数: 0 引用数: 0
h-index: 0
机构: Univ Maryland, Ctr Superconduct Res, Dept Phys, College Pk, MD 20742 USA

Anlage, SM
论文数: 0 引用数: 0
h-index: 0
机构: Univ Maryland, Ctr Superconduct Res, Dept Phys, College Pk, MD 20742 USA

Newman, HS
论文数: 0 引用数: 0
h-index: 0
机构: Univ Maryland, Ctr Superconduct Res, Dept Phys, College Pk, MD 20742 USA
[6]
High spatial resolution quantitative microwave impedance microscopy by a scanning tip microwave near-field microscope
[J].
Gao, C
;
Wei, T
;
Duewer, F
;
Lu, YL
;
Xiang, XD
.
APPLIED PHYSICS LETTERS,
1997, 71 (13)
:1872-1874

Gao, C
论文数: 0 引用数: 0
h-index: 0
机构:
UNIV CALIF BERKELEY, LAWRENCE BERKELEY LAB, DIV MAT SCI, BERKELEY, CA 94720 USA UNIV CALIF BERKELEY, LAWRENCE BERKELEY LAB, DIV MAT SCI, BERKELEY, CA 94720 USA

Wei, T
论文数: 0 引用数: 0
h-index: 0
机构:
UNIV CALIF BERKELEY, LAWRENCE BERKELEY LAB, DIV MAT SCI, BERKELEY, CA 94720 USA UNIV CALIF BERKELEY, LAWRENCE BERKELEY LAB, DIV MAT SCI, BERKELEY, CA 94720 USA

Duewer, F
论文数: 0 引用数: 0
h-index: 0
机构:
UNIV CALIF BERKELEY, LAWRENCE BERKELEY LAB, DIV MAT SCI, BERKELEY, CA 94720 USA UNIV CALIF BERKELEY, LAWRENCE BERKELEY LAB, DIV MAT SCI, BERKELEY, CA 94720 USA

Lu, YL
论文数: 0 引用数: 0
h-index: 0
机构:
UNIV CALIF BERKELEY, LAWRENCE BERKELEY LAB, DIV MAT SCI, BERKELEY, CA 94720 USA UNIV CALIF BERKELEY, LAWRENCE BERKELEY LAB, DIV MAT SCI, BERKELEY, CA 94720 USA

Xiang, XD
论文数: 0 引用数: 0
h-index: 0
机构:
UNIV CALIF BERKELEY, LAWRENCE BERKELEY LAB, DIV MAT SCI, BERKELEY, CA 94720 USA UNIV CALIF BERKELEY, LAWRENCE BERKELEY LAB, DIV MAT SCI, BERKELEY, CA 94720 USA
[7]
Novel millimeter-wave near-field resistivity microscope
[J].
Golosovsky, M
;
Davidov, D
.
APPLIED PHYSICS LETTERS,
1996, 68 (11)
:1579-1581

Golosovsky, M
论文数: 0 引用数: 0
h-index: 0
机构: Hebrew University of Jersusalem, Racah Institute of Physics

Davidov, D
论文数: 0 引用数: 0
h-index: 0
机构: Hebrew University of Jersusalem, Racah Institute of Physics
[8]
DESIGN AND IMPLEMENTATION OF A LOW-TEMPERATURE NEAR-FIELD SCANNING OPTICAL MICROSCOPE
[J].
GROBER, RD
;
HARRIS, TD
;
TRAUTMAN, JK
;
BETZIG, E
.
REVIEW OF SCIENTIFIC INSTRUMENTS,
1994, 65 (03)
:626-631

GROBER, RD
论文数: 0 引用数: 0
h-index: 0

HARRIS, TD
论文数: 0 引用数: 0
h-index: 0

TRAUTMAN, JK
论文数: 0 引用数: 0
h-index: 0

BETZIG, E
论文数: 0 引用数: 0
h-index: 0
[9]
Improved surface imaging with a near-field scanning microwave microscope using a tunable resonator
[J].
Hong, S
;
Kim, J
;
Park, W
;
Lee, K
.
APPLIED PHYSICS LETTERS,
2002, 80 (03)
:524-526

Hong, S
论文数: 0 引用数: 0
h-index: 0
机构:
Sogang Univ, Dept Phys, Seoul 121742, South Korea Sogang Univ, Dept Phys, Seoul 121742, South Korea

Kim, J
论文数: 0 引用数: 0
h-index: 0
机构:
Sogang Univ, Dept Phys, Seoul 121742, South Korea Sogang Univ, Dept Phys, Seoul 121742, South Korea

Park, W
论文数: 0 引用数: 0
h-index: 0
机构:
Sogang Univ, Dept Phys, Seoul 121742, South Korea Sogang Univ, Dept Phys, Seoul 121742, South Korea

Lee, K
论文数: 0 引用数: 0
h-index: 0
机构:
Sogang Univ, Dept Phys, Seoul 121742, South Korea Sogang Univ, Dept Phys, Seoul 121742, South Korea
[10]
Spatially resolved microwave field distribution in YBaCuO disk resonators visualized by laser scanning
[J].
Kaiser, T
;
Hein, MA
;
Müller, G
;
Perpeet, M
.
APPLIED PHYSICS LETTERS,
1998, 73 (23)
:3447-3449

Kaiser, T
论文数: 0 引用数: 0
h-index: 0
机构:
Berg Univ Gesamthsch Wuppertal, Fachbereich Phys, D-42097 Wuppertal, Germany Berg Univ Gesamthsch Wuppertal, Fachbereich Phys, D-42097 Wuppertal, Germany

Hein, MA
论文数: 0 引用数: 0
h-index: 0
机构:
Berg Univ Gesamthsch Wuppertal, Fachbereich Phys, D-42097 Wuppertal, Germany Berg Univ Gesamthsch Wuppertal, Fachbereich Phys, D-42097 Wuppertal, Germany

Müller, G
论文数: 0 引用数: 0
h-index: 0
机构:
Berg Univ Gesamthsch Wuppertal, Fachbereich Phys, D-42097 Wuppertal, Germany Berg Univ Gesamthsch Wuppertal, Fachbereich Phys, D-42097 Wuppertal, Germany

Perpeet, M
论文数: 0 引用数: 0
h-index: 0
机构:
Berg Univ Gesamthsch Wuppertal, Fachbereich Phys, D-42097 Wuppertal, Germany Berg Univ Gesamthsch Wuppertal, Fachbereich Phys, D-42097 Wuppertal, Germany