Hard x-rays nanoscale fluorescence imaging of earth and planetary science samples

被引：22

作者：

Bleuet, Pierre ^{[1
]}

Simionovici, Alexandre ^{[2
]}

Lemelle, Laurence ^{[3
]}

Ferroir, Tristan ^{[3
]}

Cloetens, Peter ^{[1
]}

Tucoulou, Remi ^{[1
]}

Susini, Jean ^{[1
]}

机构：

[1] European Synchrotron Radiat Facil, F-38043 Grenoble, France

[2] Univ Grenoble 1, CNRS, UMR 5559, OSUG LGIT, F-38041 Grenoble, France

[3] Univ Lyon, CNRS, UMR5570 USR3010, Ecole Normale Super Lyon,LST, F-69007 Lyon, France

来源：

APPLIED PHYSICS LETTERS | 2008年 / 92卷 / 21期

关键词：

D O I：

10.1063/1.2927476

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A hard x-ray nanoprobe has been implemented at the synchrotron in Grenoble, France, allowing nondestructive trace element imaging of thick samples. Its advantages are nanometer spatial resolution on samples of several tens of micrometer, very high flux, and achromaticity. Nanometer imaging of a cometary grain from the NASA Stardust mission shows the sensitivity and resolution gains obtained while radically changing our understanding of the composition of heterogeneous samples. The probe opens unique possibilities in the study of minute, fragile samples fundamental to the earth and planetary sciences, which until now were out of the reach of direct analytical methods. (c) 2008 American Institute of Physics.

引用

页数：3

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