Optical system for double-biprism electron holography

被引:25
作者
Harada, K [1 ]
Akashi, T
Togawa, Y
Matsuda, T
Tonomura, A
机构
[1] Inst Phys & Chem Res, RIKEN, Frontier Res Syst, Hatoyama, Saitama 3500395, Japan
[2] Hitachi Ltd, Adv Res Lab, Hatoyama, Saitama 3500395, Japan
[3] Hitachi Instruments Serv Co Ltd, Shinjuku Ku, Tokyo 1600004, Japan
[4] Hitachi Sci Syst Ltd, Naka Customer Ctr, Hitachinaka, Ibaraki 3120057, Japan
来源
JOURNAL OF ELECTRON MICROSCOPY | 2005年 / 54卷 / 01期
关键词
electron holography; electron biprism; electron microscopy; electron optics; reconstruction;
D O I
10.1093/jmicro/dfh098
中图分类号
TH742 [显微镜];
学科分类号
摘要
A novel system of electron interferometry and holography using two electron biprisms has been developed. The first biprism is installed in the image plane of the objective lens and the second one is set behind the first magnifying lens, inside the shadow area of the first biprism. The system can independently control two important parameters for interferograms and holograms, the fringe spacing and interference width. Thus, it gives us more flexibility on performing electron interferometry and holography. The good performance of the system was demonstrated using a 1 MV field-emission electron microscope. We introduce a variety of optical set-ups for the system and explain the advantages of each set-up in detail, with experimental results.
引用
收藏
页码:19 / 27
页数:9
相关论文
共 16 条
[1]   Record number (11000) of interference fringes obtained by a 1 MV field-emission electron microscope [J].
Akashi, T ;
Harada, K ;
Matsuda, T ;
Kasai, H ;
Tonomura, A ;
Furutsu, T ;
Moriya, N ;
Yoshida, T ;
Kawasaki, T ;
Kitazawa, K ;
Koinuma, H .
APPLIED PHYSICS LETTERS, 2002, 81 (10) :1922-1924
[2]   ELECTRON HOLOGRAPHY OBSERVATION OF VORTEX LATTICES IN A SUPERCONDUCTOR [J].
BONEVICH, JE ;
HARADA, K ;
MATSUDA, T ;
KASAI, H ;
YOSHIDA, T ;
POZZI, G ;
TONOMURA, A .
PHYSICAL REVIEW LETTERS, 1993, 70 (19) :2952-2955
[3]   Transmission laser microscope using the phase-shifting technique and its application to measurement of optical waveguides [J].
Endo, J ;
Chen, J ;
Kobayashi, D ;
Wada, Y ;
Fujita, H .
APPLIED OPTICS, 2002, 41 (07) :1308-1314
[4]  
HARADA K, 1988, J ELECTRON MICROSC, V37, P199
[5]   High-resolution observation by double-biprism electron holography [J].
Harada, K ;
Tonomura, A ;
Matsuda, T ;
Akashi, T ;
Togawa, Y .
JOURNAL OF APPLIED PHYSICS, 2004, 96 (11) :6097-6102
[6]   Double-biprism electron interferometry [J].
Harada, K ;
Tonomura, A ;
Togawa, Y ;
Akashi, T ;
Matsuda, T .
APPLIED PHYSICS LETTERS, 2004, 84 (17) :3229-3231
[7]  
KAWASAKI K, 1991, JPN J APPL PHYS, V30, pL1830
[8]   Fine crystal lattice fringes observed using a transmission electron microscope with 1 MeV coherent electron waves [J].
Kawasaki, T ;
Yoshida, T ;
Matsuda, T ;
Osakabe, N ;
Tonomura, A ;
Matsui, I ;
Kitazawa, K .
APPLIED PHYSICS LETTERS, 2000, 76 (10) :1342-1344
[9]  
Lehmann M, 2002, MICROSC MICROANAL, V8, P447, DOI 10.1017/S1431927602020147
[10]   ELECTRON HOLOGRAPHY APPROACHING ATOMIC RESOLUTION [J].
LICHTE, H .
ULTRAMICROSCOPY, 1986, 20 (03) :293-304