Wide bandgap semiconductor power electronics

被引:11
作者
Weitzel, CE [1 ]
机构
[1] Motorola Inc, Mat Res & Strateg Technol, Tempe, AZ 85284 USA
来源
INTERNATIONAL ELECTRON DEVICES MEETING 1998 - TECHNICAL DIGEST | 1998年
关键词
D O I
10.1109/IEDM.1998.746244
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Wide bandgap semiconductors, SiC and GaN, have attracted increased attention because of their potential for higher performance switching and RF power devices. SIC Schottky diodes, MOSFET's, SIT's and MESFET's and AlGaN/GaN HFET's are described and their performance compared to that of Si and GaAs devices.
引用
收藏
页码:51 / 54
页数:4
相关论文
共 22 条
[1]   1400V 4H-SiC power MOSFETs [J].
Agarwal, AK ;
Casady, JB ;
Rowland, LB ;
Valek, WF ;
Brandt, CD .
SILICON CARBIDE, III-NITRIDES AND RELATED MATERIALS, PTS 1 AND 2, 1998, 264-2 :989-992
[2]  
BOJKO RJ, 1998, 1998 56 ANN DEV RES, P96
[3]  
CARDULLO M, 1997, WIRELESS SYSTEMS JUN, P28
[4]   Vital issues for SiC power devices [J].
Hara, K .
SILICON CARBIDE, III-NITRIDES AND RELATED MATERIALS, PTS 1 AND 2, 1998, 264-2 :901-906
[5]   GaN based heterostructure for high power devices [J].
Khan, MA ;
Chen, Q ;
Shur, MS ;
Dermott, BT ;
Higgins, JA ;
Burm, J ;
Schaff, WJ ;
Eastman, LF .
SOLID-STATE ELECTRONICS, 1997, 41 (10) :1555-1559
[6]   GaN microwave electronics [J].
Mishra, UK ;
Wu, YF ;
Keller, BP ;
Keller, S ;
Denbaars, SP .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1998, 46 (06) :756-761
[7]   4H-SiC MESFET with 65.7% power added efficiency at 850 MHz [J].
Moore, KE ;
Weitzel, CE ;
Nordquist, KJ ;
Pond, LL ;
Palmour, JW ;
Allen, S ;
Carter, CH .
IEEE ELECTRON DEVICE LETTERS, 1997, 18 (02) :69-70
[8]   LARGE-BAND-GAP SIC, III-V NITRIDE, AND II-VI ZNSE-BASED SEMICONDUCTOR-DEVICE TECHNOLOGIES [J].
MORKOC, H ;
STRITE, S ;
GAO, GB ;
LIN, ME ;
SVERDLOV, B ;
BURNS, M .
JOURNAL OF APPLIED PHYSICS, 1994, 76 (03) :1363-1398
[9]  
Morse AW, 1996, IEEE MTT-S, P677, DOI 10.1109/MWSYM.1996.511030
[10]   FIELD-EFFECT TRANSISTOR VERSUS ANALOG TRANSISTOR (STATIC INDUCTION TRANSISTOR) [J].
NISHIZAWA, JI ;
TERASAKI, T ;
SHIBATA, J .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1975, ED22 (04) :185-197