Near-field spectroscopy of silicon dioxide thin films

被引：116

作者：

Zhang, L. M. ^{[1
]}

Andreev, G. O. ^{[2
]}

Fei, Z. ^{[2
]}

McLeod, A. S. ^{[2
]}

Dominguez, G. ^{[3
]}

Thiemens, M. ^{[3
]}

Castro-Neto, A. H. ^{[4
,5
]}

Basov, D. N. ^{[2
]}

Fogler, M. M. ^{[2
]}

机构：

[1] Boston Univ, Dept Phys, Boston, MA 02215 USA

[2] Univ Calif San Diego, Dept Phys, La Jolla, CA 92093 USA

[3] Univ Calif San Diego, Dept Chem, La Jolla, CA 92093 USA

[4] Natl Univ Singapore, Graphene Res Ctr, Singapore 117542, Singapore

[5] Natl Univ Singapore, Dept Phys, Singapore 117542, Singapore

来源：

PHYSICAL REVIEW B | 2012年 / 85卷 / 07期

关键词：

SURFACE-ENHANCED SPECTROSCOPY; ELASTIC LIGHT-SCATTERING; OPTICAL MICROSCOPY; SPHERE; SUBSTRATE; NANOSCOPY; PLASMONS; SCALE; PROBE; TIP;

D O I：

10.1103/PhysRevB.85.075419

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We analyze the results of scanning near-field infrared spectroscopy performed on thin films of a-SiO2 on Si substrate. The measured near-field signal exhibits surface-phonon resonances whose strength has a prominent thickness dependence in the range from 2 to 300 nm. These observations are compared with calculations in which the tip of the near-field infrared spectrometer is modeled either as a point dipole or an elongated spheroid. The latter model accounts for the antenna effect of the tip and gives a better agreement with the experiment. Possible applications of the near-field technique for depth profiling of layered nanostructures are discussed.

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页数：8

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共 41 条

[1] Substrate-enhanced infrared near-field spectroscopy [J].

Aizpurua, Javier ;

Taubner, Thomas ;

Javier Garcia de Abajo, F. ;

Brehm, Markus ;

Hillenbrand, Rainer .

OPTICS EXPRESS, 2008, 16 (03) :1529-1545

[2] Broadband-infrared assessment of phonon resonance in scattering-type near-field microscopy [J].

Amarie, S. ;

Keilmann, F. .

PHYSICAL REVIEW B, 2011, 83 (04)

[3] THE EFFECTS OF THE INTERACTION BETWEEN RESONANCES IN THE ELECTROMAGNETIC RESPONSE OF A SPHERE-PLANE STRUCTURE - APPLICATIONS TO SURFACE ENHANCED SPECTROSCOPY [J].

ARAVIND, PK ;

METIU, H .

SURFACE SCIENCE, 1983, 124 (2-3) :506-528

[4] USE OF A PERFECTLY CONDUCTING SPHERE TO EXCITE THE PLASMON OF A FLAT SURFACE .1. CALCULATION OF THE LOCAL FIELD WITH APPLICATIONS TO SURFACE-ENHANCED SPECTROSCOPY [J].

ARAVIND, PK ;

METIU, H .

JOURNAL OF PHYSICAL CHEMISTRY, 1982, 86 (26) :5076-5084

[5] Electrodynamics of correlated electron materials [J].

Basov, D. N. ;

Averitt, Richard D. ;

van der Marel, Dirk ;

Dressel, Martin ;

Haule, Kristjan .

REVIEWS OF MODERN PHYSICS, 2011, 83 (02) :471-541

[6] Manifesto for a higher Tc [J].

Basov, D. N. ;

Chubukov, Andrey V. .

NATURE PHYSICS, 2011, 7 (04) :272-276

[7] Analytical model for quantitative prediction of material contrasts in scattering-type near-field optical microscopy [J].

Cvitkovic, A. ;

Ocelic, N. ;

Hillenbrand, R. .

OPTICS EXPRESS, 2007, 15 (14) :8550-8565

[8] Full simulations of the apertureless scanning near field optical microscopy signal: achievable resolution and contrast [J].

Esteban, R. ;

Vogelgesang, R. ;

Kern, K. .

OPTICS EXPRESS, 2009, 17 (04) :2518-2529

[9] Infrared Nanoscopy of Dirac Plasmons at the Graphene-SiO2 Interface [J].

Fei, Zhe ;

Andreev, Gregory O. ;

Bao, Wenzhong ;

Zhang, Lingfeng M. ;

McLeod, Alexander S. ;

Wang, Chen ;

Stewart, Margaret K. ;

Zhao, Zeng ;

Dominguez, Gerardo ;

Thiemens, Mark ;

Fogler, Michael M. ;

Tauber, Michael J. ;

Castro-Neto, Antonio H. ;

Lau, Chun Ning ;

Keilmann, Fritz ;

Basov, Dimitri N. .

NANO LETTERS, 2011, 11 (11) :4701-4705

[10] ELECTROMAGNETIC-INTERACTIONS OF MOLECULES WITH METAL-SURFACES [J].

FORD, GW ;

WEBER, WH .

PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS, 1984, 113 (04) :195-287

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