Epitaxial Pb(Zr,Ti)O3 thin films on LaAlO3 (100) by dipping-pyrolysis process

被引：3

作者：

Hwang, KS ^{[1
]}

Kim, BH ^{[1
]}

机构：

[1] Chonnam Natl Univ, Dept Ceram Engn, Buk Ku, Kwangju 500757, South Korea

来源：

APPLIED SURFACE SCIENCE | 1999年 / 140卷 / 1-2期

关键词：

Pb(Zr; Ti)O-3; epitaxial relationship;

D O I：

10.1016/S0169-4332(98)00621-7

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Epitaxially grown Pb(Zr,Ti)O-3 thin films were prepared on LaAlO3 (100) substrates by the dipping-pyrolysis (DP) process using metal naphthenates as starting materials. Homogeneous Pb-Zr-Ti solutions with toluene were spin-coated onto the substrates and pyrolyzed at 500 degrees C. Highly oriented Pb(Zr,Ti)O-3 films confirmed by X-ray diffraction (XRD) theta-2 theta scans were obtained by annealing at 750 degrees C in air. The XRD pole-figure analysis and reciprocal space mapping of the resulting 0.6 mu m films showed that the film comprising the c-axis oriented tetragonal phase have an epitaxial relationship with the LaAlO3 substrates. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：235 / 238

页数：4

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