Roughness transitions of diamond(100) induced by hydrogen-plasma treatment

被引:14
作者
Koslowski, B [1 ]
Strobel, S [1 ]
Wenig, MJ [1 ]
Ziemann, P [1 ]
机构
[1] Univ Ulm, Abt Festkorperphys, D-89069 Ulm, Germany
来源
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1998年 / 66卷 / Suppl 1期
关键词
D O I
10.1007/s003390051318
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
To investigate the influence of hydrogen-plasma treatment on diamond(100) surfaces, heavily boron (B)-doped HPHT diamond crystals were mechanically and chemo-mechanically polished, and exposed to a microwave-assisted hydrogen plasma on a time scale of several minutes. The resulting surface morphology was analyzed on macroscopic scales by stylus profilometry (PFM) and on microscopic scales by STM and AFM. The polished samples have a roughness of typically 100 pm(rms) (PFM), with no obvious anisotropic structures at the surface. After exposure of the B-doped diamond(100) to the H-plasma, the roughness increases dramatically, and pronounced anisotropic structures appear, these being closely aligned with the crystallographic axis' and planes. An exposure for 3 minutes to the plasma leads to an increase of the roughness to 2-4 nm(rms) (STM), and a 'brick-wall' pattern appears, formed by weak cusps running along [110]. Very frequently, the cusps are replaced by 'negative' pyramids that are bordered by {11X} facets. After an exposure of an additional 5 minutes, the surface roughness of the B-doped samples increases further to 20-40 nm,, (STM), and frequently exhibits a regular pattern with structures at a characteristic length scale of about 100 nm. Those structures are aligned approximately with [110] and they are faceted with faces of approximately {XX1}. These results will be discussed in terms of strain relaxation, similar to the surface roughening observed on SiGe/Si and anisotropic etching.
引用
收藏
页码:S1159 / S1163
页数:5
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