共 17 条
Imaging the formation of a p-n junction in a suspended carbon nanotube with scanning photocurrent microscopy
被引:15
作者:
Buchs, Gilles
[1
]
Barkelid, Maria
[1
]
Bagiante, Salvatore
[2
]
Steele, Gary A.
[1
]
Zwiller, Val
[1
]
机构:
[1] Kavli Inst Nanosci, TU Delft, NL-2600 GA Delft, Netherlands
[2] Ist Microelettron Microsistemi, Consiglio Nazl Ric, I-95121 Catania, Italy
关键词:
TRANSISTORS;
GENERATION;
DIODES;
D O I:
10.1063/1.3645022
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
We use scanning photocurrent microscopy (SPCM) to investigate individual suspended semiconducting carbon nanotube devices where the potential profile is engineered by means of local gates. In situ tunable p-n junctions can be generated at any position along the nanotube axis. Combining SPCM with transport measurements allows a detailed microscopic study of the evolution of the band profiles as a function of the gates voltage. Here we study the emergence of a p-n and a n-p junctions out of a n-type transistor channel using two local gates. In both cases the I - V curves recorded for gate configurations corresponding to the formation of the p-n or n-p junction in the SPCM measurements reveal a clear transition from resistive to rectification regimes. The rectification curves can be fitted well to the Shockley diode model with a series resistor and reveal a clear ideal diode behavior. (c) 2011 American Institute of Physics. [doi: 10.1063/1.3645022]
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