Electrostatic engineering of nanotube transistors for improved performance

被引:78
作者
Heinze, S [1 ]
Tersoff, J
Avouris, P
机构
[1] IBM Corp, Div Res, TJ Watson Res Ctr, Yorktown Hts, NY 10598 USA
[2] Univ Hamburg, Inst Appl Phys, D-20355 Hamburg, Germany
关键词
D O I
10.1063/1.1632531
中图分类号
O59 [应用物理学];
学科分类号
摘要
With decreasing device dimensions, the performance of carbon nanotube field-effect transistors (CNFETs) is limited by high OFF currents except at low drain voltages. Introducing an asymmetry between source and drain electrostatics can improve the performance, reducing OFF currents and extending the usable range of drain voltage. The improvement is most dramatic for ambipolar Schottky-barrier CNFETs. Moreover, this approach allows a single device to exhibit equally good performance as an n- or p-type transistor, by changing only the sign of the drain voltage. Even for CNFETs having ohmic contacts, an asymmetric design can greatly improve the performance for small-bandgap nanotubes. (C) 2003 American Institute of Physics.
引用
收藏
页码:5038 / 5040
页数:3
相关论文
共 11 条
  • [1] Field-modulated carrier transport in carbon nanotube transistors
    Appenzeller, J
    Knoch, J
    Derycke, V
    Martel, R
    Wind, S
    Avouris, P
    [J]. PHYSICAL REVIEW LETTERS, 2002, 89 (12) : 126801 - 126801
  • [2] Logic circuits with carbon nanotube transistors
    Bachtold, A
    Hadley, P
    Nakanishi, T
    Dekker, C
    [J]. SCIENCE, 2001, 294 (5545) : 1317 - 1320
  • [3] Controlled creation of a carbon nanotube diode by a scanned gate
    Freitag, M
    Radosavljevic, M
    Zhou, YX
    Johnson, AT
    Smith, WF
    [J]. APPLIED PHYSICS LETTERS, 2001, 79 (20) : 3326 - 3328
  • [4] GUO J, IN PRESS IEEE T ELEC
  • [5] Carbon nanotubes as Schottky barrier transistors
    Heinze, S
    Tersoff, J
    Martel, R
    Derycke, V
    Appenzeller, J
    Avouris, P
    [J]. PHYSICAL REVIEW LETTERS, 2002, 89 (10)
  • [6] HEINZE S, IN PRESS PHYS REV B
  • [7] Ballistic carbon nanotube field-effect transistors
    Javey, A
    Guo, J
    Wang, Q
    Lundstrom, M
    Dai, HJ
    [J]. NATURE, 2003, 424 (6949) : 654 - 657
  • [8] Schottky barrier thin-film transistor (SBTFT) with silicided source/drain and field-induced drain extension
    Lin, HC
    Yeh, KL
    Huang, RG
    Lin, CY
    Huang, TY
    [J]. IEEE ELECTRON DEVICE LETTERS, 2001, 22 (04) : 179 - 181
  • [9] Ambipolar electrical transport in semiconducting single-wall carbon nanotubes
    Martel, R
    Derycke, V
    Lavoie, C
    Appenzeller, J
    Chan, KK
    Tersoff, J
    Avouris, P
    [J]. PHYSICAL REVIEW LETTERS, 2001, 87 (25) : 256805 - 1
  • [10] Drain voltage scaling in carbon nanotube transistors
    Radosavljevic, M
    Heinze, S
    Tersoff, J
    Avouris, P
    [J]. APPLIED PHYSICS LETTERS, 2003, 83 (12) : 2435 - 2437