Energy dependence of quantum dot formation by ion sputtering

被引:104
作者
Facsko, S
Kurz, H
Dekorsy, T
机构
[1] Rhein Westfal TH Aachen, Inst Semicond Elect, D-52056 Aachen, Germany
[2] Forschungszentrum Rossendorf EV, Inst Ionenstrahlphys & Mat Forsch, D-01314 Dresden, Germany
关键词
D O I
10.1103/PhysRevB.63.165329
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Ordered quantum dot patterns are generated on GaSb and InSb surfaces due to a surface instability induced by Ar+-ion sputtering at normal incidence. The characteristic length of the generated patterns scales with the square root of the ion energy over the energy range of 75-1800 eV. This energy dependence is compared to the solutions of the isotropic Kuramoto-Sivashinshy equation and allows the determination of the lateral width of the energy distribution deposited by the incident ions in the very-low-energy range. We show that the observed energy dependence is in agreement with the linear continuum theory under the assumption that the dominant smoothing process is due to effective ion-induced diffusion without mass transport on the surface.
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页数:5
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