Contact resonances in voltage-modulated force microscopy

被引：102

作者：

Harnagea, C

Alexe, M

Hesse, D

Pignolet, A

机构：

[1] Max Planck Inst Microstruct Phys, D-06120 Halle An Der Saale, Germany

[2] Univ Quebec, INRS Energie Mat & Telecommun, Varennes, PQ, Canada

来源：

APPLIED PHYSICS LETTERS | 2003年 / 83卷 / 02期

关键词：

D O I：

10.1063/1.1592307

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A study of the frequency dependence of the signal in piezoresponse scanning force microscopy of ferroelectric materials has been performed. It is found that, for soft cantilevers, the signal is governed by the cantilever elastic properties. Both ferroelectric-electromechanical and electrostatic interaction contributions to the overall signal were found to depend on the frequency of the testing voltage. Indications for optimal measurement regimes are given. (C) 2003 American Institute of Physics.

引用

页码：338 / 340

页数：3

共 15 条

[11] Imaging mechanism of piezoresponse force microscopy of ferroelectric surfaces [J].