共 74 条
Fundamental transport processes in ensembles of silicon quantum dots
被引:50
作者:

Balberg, I.
论文数: 0 引用数: 0
h-index: 0
机构:
Hebrew Univ Jerusalem, Racah Inst Phys, IL-91904 Jerusalem, Israel Hebrew Univ Jerusalem, Racah Inst Phys, IL-91904 Jerusalem, Israel

Savir, E.
论文数: 0 引用数: 0
h-index: 0
机构: Hebrew Univ Jerusalem, Racah Inst Phys, IL-91904 Jerusalem, Israel

Jedrzejewski, J.
论文数: 0 引用数: 0
h-index: 0
机构: Hebrew Univ Jerusalem, Racah Inst Phys, IL-91904 Jerusalem, Israel

Nassiopoulou, A. G.
论文数: 0 引用数: 0
h-index: 0
机构: Hebrew Univ Jerusalem, Racah Inst Phys, IL-91904 Jerusalem, Israel

Gardelis, S.
论文数: 0 引用数: 0
h-index: 0
机构: Hebrew Univ Jerusalem, Racah Inst Phys, IL-91904 Jerusalem, Israel
机构:
[1] Hebrew Univ Jerusalem, Racah Inst Phys, IL-91904 Jerusalem, Israel
[2] Natl Ctr Sci Res Demokritos, IMEL, GR-15310 Athens, Greece
关键词:
D O I:
10.1103/PhysRevB.75.235329
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
For a better understanding of the physical properties of semiconductor quantum dot ensembles, we have followed the behaviors of the transport and photoluminescence above, at, and below the percolation threshold of ensembles of Si quantum dots that are embedded in a SiO2 matrix. Our study revealed the roles of the interdot conduction, the single dot charging, and the connectivity in such systems. We conclude that while the first two determine the global transport, a connectivity dependent migration determines the coupling between the electrical and optical properties.
引用
收藏
页数:8
相关论文
共 74 条
[31]
Excitons in Si nanocrystals:: Confinement and migration effects -: art. no. 195309
[J].
Heitmann, J
;
Müller, F
;
Yi, LX
;
Zacharias, M
;
Kovalev, D
;
Eichhorn, F
.
PHYSICAL REVIEW B,
2004, 69 (19)
:195309-1

Heitmann, J
论文数: 0 引用数: 0
h-index: 0
机构: Max Planck Inst Mikrostrukturphys, D-06120 Halle Saale, Germany

Müller, F
论文数: 0 引用数: 0
h-index: 0
机构: Max Planck Inst Mikrostrukturphys, D-06120 Halle Saale, Germany

Yi, LX
论文数: 0 引用数: 0
h-index: 0
机构: Max Planck Inst Mikrostrukturphys, D-06120 Halle Saale, Germany

Zacharias, M
论文数: 0 引用数: 0
h-index: 0
机构: Max Planck Inst Mikrostrukturphys, D-06120 Halle Saale, Germany

Kovalev, D
论文数: 0 引用数: 0
h-index: 0
机构: Max Planck Inst Mikrostrukturphys, D-06120 Halle Saale, Germany

Eichhorn, F
论文数: 0 引用数: 0
h-index: 0
机构: Max Planck Inst Mikrostrukturphys, D-06120 Halle Saale, Germany
[32]
A theoretical study of light emission from nanoscale silicon
[J].
Hill, NA
;
Whaley, KB
.
JOURNAL OF ELECTRONIC MATERIALS,
1996, 25 (02)
:269-285

Hill, NA
论文数: 0 引用数: 0
h-index: 0
机构: Department of Chemistry, University of California-Berkeley, Berkeley

Whaley, KB
论文数: 0 引用数: 0
h-index: 0
机构: Department of Chemistry, University of California-Berkeley, Berkeley
[33]
ELECTRONIC CONDUCTIVITY OF HYDROGENATED NANOCRYSTALLINE SILICON FILMS
[J].
HU, GY
;
OCONNELL, RF
;
HE, YL
;
YU, MB
.
JOURNAL OF APPLIED PHYSICS,
1995, 78 (06)
:3945-3948

HU, GY
论文数: 0 引用数: 0
h-index: 0
机构:
BEIJING UNIV AERONAUT & ASTRONAUT,AMORPHOUS PHYS RES LAB,BEIJING 100083,PEOPLES R CHINA BEIJING UNIV AERONAUT & ASTRONAUT,AMORPHOUS PHYS RES LAB,BEIJING 100083,PEOPLES R CHINA

OCONNELL, RF
论文数: 0 引用数: 0
h-index: 0
机构:
BEIJING UNIV AERONAUT & ASTRONAUT,AMORPHOUS PHYS RES LAB,BEIJING 100083,PEOPLES R CHINA BEIJING UNIV AERONAUT & ASTRONAUT,AMORPHOUS PHYS RES LAB,BEIJING 100083,PEOPLES R CHINA

HE, YL
论文数: 0 引用数: 0
h-index: 0
机构:
BEIJING UNIV AERONAUT & ASTRONAUT,AMORPHOUS PHYS RES LAB,BEIJING 100083,PEOPLES R CHINA BEIJING UNIV AERONAUT & ASTRONAUT,AMORPHOUS PHYS RES LAB,BEIJING 100083,PEOPLES R CHINA

YU, MB
论文数: 0 引用数: 0
h-index: 0
机构:
BEIJING UNIV AERONAUT & ASTRONAUT,AMORPHOUS PHYS RES LAB,BEIJING 100083,PEOPLES R CHINA BEIJING UNIV AERONAUT & ASTRONAUT,AMORPHOUS PHYS RES LAB,BEIJING 100083,PEOPLES R CHINA
[34]
Electron trapping, storing, and emission in nanocrystalline Si dots by capacitance-voltage and conductance-voltage measurements
[J].
Huang, SY
;
Banerjee, S
;
Tung, RT
;
Oda, S
.
JOURNAL OF APPLIED PHYSICS,
2003, 93 (01)
:576-581

Huang, SY
论文数: 0 引用数: 0
h-index: 0
机构:
Tokyo Inst Technol, Res Ctr Quantum Effect Elect, Meguro Ku, Tokyo 1528552, Japan Tokyo Inst Technol, Res Ctr Quantum Effect Elect, Meguro Ku, Tokyo 1528552, Japan

Banerjee, S
论文数: 0 引用数: 0
h-index: 0
机构:
Tokyo Inst Technol, Res Ctr Quantum Effect Elect, Meguro Ku, Tokyo 1528552, Japan Tokyo Inst Technol, Res Ctr Quantum Effect Elect, Meguro Ku, Tokyo 1528552, Japan

Tung, RT
论文数: 0 引用数: 0
h-index: 0
机构:
Tokyo Inst Technol, Res Ctr Quantum Effect Elect, Meguro Ku, Tokyo 1528552, Japan Tokyo Inst Technol, Res Ctr Quantum Effect Elect, Meguro Ku, Tokyo 1528552, Japan

Oda, S
论文数: 0 引用数: 0
h-index: 0
机构:
Tokyo Inst Technol, Res Ctr Quantum Effect Elect, Meguro Ku, Tokyo 1528552, Japan Tokyo Inst Technol, Res Ctr Quantum Effect Elect, Meguro Ku, Tokyo 1528552, Japan
[35]
Single-electron tunneling through Si nanocrystals dispersed in phosphosilicate glass thin films
[J].
Inoue, Y
;
Tanaka, A
;
Fujii, M
;
Hayashi, S
;
Yamamoto, K
.
JOURNAL OF APPLIED PHYSICS,
1999, 86 (06)
:3199-3203

Inoue, Y
论文数: 0 引用数: 0
h-index: 0
机构: Kobe Univ, Fac Engn, Dept Elect & Elect Engn, Nada Ku, Kobe, Hyogo 6578501, Japan

Tanaka, A
论文数: 0 引用数: 0
h-index: 0
机构: Kobe Univ, Fac Engn, Dept Elect & Elect Engn, Nada Ku, Kobe, Hyogo 6578501, Japan

Fujii, M
论文数: 0 引用数: 0
h-index: 0
机构:
Kobe Univ, Fac Engn, Dept Elect & Elect Engn, Nada Ku, Kobe, Hyogo 6578501, Japan Kobe Univ, Fac Engn, Dept Elect & Elect Engn, Nada Ku, Kobe, Hyogo 6578501, Japan

Hayashi, S
论文数: 0 引用数: 0
h-index: 0
机构: Kobe Univ, Fac Engn, Dept Elect & Elect Engn, Nada Ku, Kobe, Hyogo 6578501, Japan

论文数: 引用数:
h-index:
机构:
[36]
Charge storage and interface states effects in Si-nanocrystal memory obtained using low-energy Si+ implantation and annealing
[J].
Kapetanakis, E
;
Normand, P
;
Tsoukalas, D
;
Beltsios, K
;
Stoemenos, J
;
Zhang, S
;
van den Berg, J
.
APPLIED PHYSICS LETTERS,
2000, 77 (21)
:3450-3452

Kapetanakis, E
论文数: 0 引用数: 0
h-index: 0
机构:
NCSR Demokritos, Inst Microelect, Aghia Paraskevi 15310, Greece NCSR Demokritos, Inst Microelect, Aghia Paraskevi 15310, Greece

Normand, P
论文数: 0 引用数: 0
h-index: 0
机构: NCSR Demokritos, Inst Microelect, Aghia Paraskevi 15310, Greece

Tsoukalas, D
论文数: 0 引用数: 0
h-index: 0
机构: NCSR Demokritos, Inst Microelect, Aghia Paraskevi 15310, Greece

Beltsios, K
论文数: 0 引用数: 0
h-index: 0
机构: NCSR Demokritos, Inst Microelect, Aghia Paraskevi 15310, Greece

Stoemenos, J
论文数: 0 引用数: 0
h-index: 0
机构: NCSR Demokritos, Inst Microelect, Aghia Paraskevi 15310, Greece

Zhang, S
论文数: 0 引用数: 0
h-index: 0
机构: NCSR Demokritos, Inst Microelect, Aghia Paraskevi 15310, Greece

van den Berg, J
论文数: 0 引用数: 0
h-index: 0
机构: NCSR Demokritos, Inst Microelect, Aghia Paraskevi 15310, Greece
[37]
THE SINGLE-ELECTRON TRANSISTOR
[J].
KASTNER, MA
.
REVIEWS OF MODERN PHYSICS,
1992, 64 (03)
:849-858

KASTNER, MA
论文数: 0 引用数: 0
h-index: 0
机构:
MIT,ELECTR RES LAB,CAMBRIDGE,MA 02139 MIT,ELECTR RES LAB,CAMBRIDGE,MA 02139
[38]
Visible light emissions and single-electron tunneling from silicon quantum dots embedded in Si-rich SiO2 deposited in plasma phase
[J].
Kim, KJ
.
PHYSICAL REVIEW B,
1998, 57 (20)
:13072-13076

Kim, KJ
论文数: 0 引用数: 0
h-index: 0
机构:
OPTEL Semicond Corp, Iksan 570210, South Korea OPTEL Semicond Corp, Iksan 570210, South Korea
[39]
HOPPING CONDUCTIVITY OF GRANULAR METALS - TEST NETWORK METHOD
[J].
LEVIN, GA
.
PHYSICS LETTERS A,
1989, 142 (6-7)
:405-411

LEVIN, GA
论文数: 0 引用数: 0
h-index: 0
[40]
A study on Si nanocrystal formation in Si-implanted SiO2 films by x-ray photoelectron spectroscopy
[J].
Liu, Y
;
Chen, TP
;
Fu, YQ
;
Tse, MS
;
Hsieh, JH
;
Ho, PF
;
Liu, YC
.
JOURNAL OF PHYSICS D-APPLIED PHYSICS,
2003, 36 (19)
:L97-L100

Liu, Y
论文数: 0 引用数: 0
h-index: 0
机构:
Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore

Chen, TP
论文数: 0 引用数: 0
h-index: 0
机构: Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore

Fu, YQ
论文数: 0 引用数: 0
h-index: 0
机构: Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore

Tse, MS
论文数: 0 引用数: 0
h-index: 0
机构: Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore

Hsieh, JH
论文数: 0 引用数: 0
h-index: 0
机构: Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore

Ho, PF
论文数: 0 引用数: 0
h-index: 0
机构: Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore

Liu, YC
论文数: 0 引用数: 0
h-index: 0
机构: Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore