Effects of van der Waals force and thermal stresses on pull-in instability of clamped rectangular microplates

被引:101
作者
Batra, Romesh C. [2 ]
Porfiri, Maurizio [1 ]
Spinello, Davide [3 ]
机构
[1] Polytech Univ, Dept Mech & Aerosp Engn, 6 Metrotech Ctr, Brooklyn, NY 11201 USA
[2] Virginia Polytech Inst & State Univ, Dept Engn Sci & Mech, Blacksburg, VA 24061 USA
[3] Virginia Polytech Inst & State Univ, Bradley Dept Elect & Comp Engn, Blacksburg, VA 24061 USA
关键词
microelectromechanical systems; microplate; van der Waals force; pull-in instability; microsensor;
D O I
10.3390/s8021048
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
We study the influence of von Karman nonlinearity, van der Waals force, and thermal stresses on pull-in instability and small vibrations of electrostatically actuated microplates. We use the Galerkin method to develop a tractable reduced-order model for electrostatically actuated clamped rectangular microplates in the presence of van der Waals forces and thermal stresses. More specifically, we reduce the governing two-dimensional nonlinear transient boundary-value problem to a single nonlinear ordinary differential equation. For the static problem, the pull-in voltage and the pull-in displacement are determined by solving a pair of nonlinear algebraic equations. The fundamental vibration frequency corresponding to a deflected configuration of the microplate is determined by solving a linear algebraic equation. The proposed reduced-order model allows for accurately estimating the combined effects of van der Waals force and thermal stresses on the pull-in voltage and the pull-in deflection profile with an extremely limited computational effort.
引用
收藏
页码:1048 / 1069
页数:22
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