Characterization of single-event upsets in a flash analog-to-digital converter (AD9058)

被引：14

作者：

Buchner, SP ^{[1
]}

Meehan, TJ

Campbell, AB

Clark, KA

McMorrow, D

机构：

[1] SFA Inc, Largo, MD 20774 USA

[2] USN, Res Lab, Washington, DC 20375 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2000年 / 47卷 / 06期

关键词：

D O I：

10.1109/23.903777

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Single-event upsets were observed in a flash analog-to-digital converter (AD9058) included as part of II radiation effects experiment on board a satellite. The origins of the upsets mere identified using a pulsed laser and confirmed by exposing the AD9058 to both heavy ions and protons at accelerator facilities, The salient result of this work is that the single-event-upset cross-section depends on the value of the analog input but does not appear to depend on clock frequency. Therefore, using a single value for the analog input during ground testing may give an incorrect estimate of the error rate expected during operation in space where the input can vary over the full voltage range.

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收藏

页码：2358 / 2364

页数：7

相关论文

共 11 条

[1] Laboratory tests for single-event effects [J].

Buchner, S ;

McMorrow, D ;

Melinger, J ;

Campbell, AB .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1996, 43 (02) :678-686

[2] Comparison of error rates in combinational and sequential logic [J].

Buchner, S ;

Baze, M ;

Brown, D ;

McMorrow, D ;

Melinger, J .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1997, 44 (06) :2209-2216

[3]

HOESCHELE DF, 1994, ANALOG TO DIGITAL DI

[4] OBSERVATION OF SINGLE EVENT UPSETS IN ANALOG MICROCIRCUITS [J].

KOGA, R ;

PINKERTON, SD ;

MOSS, SC ;

MAYER, DC ;

LALUMONDIERE, S ;

HANSEL, SJ ;

CRAWFORD, KB ;

CRAIN, WR .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1993, 40 (06) :1838-1844

[5] Current single event effect test results for candidate spacecraft electronics [J].

LaBel, KA ;

Moran, AK ;

Hawkins, DK ;

Sanders, AB ;

Seidleck, CM ;

Kim, HS ;

Forney, JE ;

Stassinopoulos, EG ;

Marshall, P ;

Dale, C ;

Kinnison, J ;

Carkhuff, B .

1996 IEEE RADIATION EFFECTS DATA WORKSHOP, WORKSHOP RECORD, 1996, :19-27

[6]

LABEL KA, 1994, 1994 IEEE RAD EFF DA, P64

[7] CRITICAL-EVALUATION OF THE PULSED-LASER METHOD FOR SINGLE EVENT EFFECTS TESTING AND FUNDAMENTAL-STUDIES [J].

MELINGER, JS ;

BUCHNER, S ;

MCMORROW, D ;

STAPOR, WJ ;

WEATHERFORD, TR ;

CAMPBELL, AB .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1994, 41 (06) :2574-2584

[8] TRANSIENT RADIATION TEST TECHNIQUES FOR HIGH-SPEED ANALOG-TO-DIGITAL CONVERTERS [J].

TURFLINGER, TL ;

DAVEY, MV .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1989, 36 (06) :2356-2361

[9] SINGLE EVENT EFFECTS IN ANALOG-TO-DIGITAL CONVERTERS - DEVICE PERFORMANCE AND SYSTEM IMPACT [J].

TURFLINGER, TL ;

DAVEY, MV ;

MAPPES, BM .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1994, 41 (06) :2187-2194

[10] UNDERSTANDING SINGLE EVENT PHENOMENA IN COMPLEX ANALOG AND DIGITAL INTEGRATED-CIRCUITS [J].

TURFLINGER, TL ;

DAVEY, MV .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1990, 37 (06) :1832-1838