共 21 条
[1]
Analysis of wafer bonding by infrared transmission
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS,
1996, 35 (07)
:3807-3809
[2]
HIGHLY SENSITIVE OPTICAL METHOD FOR THE CHARACTERIZATION OF SIO2-FILMS IN BONDED WAFERS
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS,
1995, 34 (10B)
:L1409-L1411
[4]
DIVERSITY AND FEASIBILITY OF DIRECT BONDING - A SURVEY OF A DEDICATED OPTICAL-TECHNOLOGY
[J].
APPLIED OPTICS,
1994, 33 (07)
:1154-1169