Gigascale integration: Is the sky the limit?

被引：23

作者：

Meindl, JD

机构：

[1] Department of Microelectronics, Georgia Institute of Technology, Sch. of Elec. and Comp. Engineering, Atlanta, GA

来源：

IEEE CIRCUITS AND DEVICES MAGAZINE | 1996年 / 12卷 / 06期

关键词：

D O I：

10.1109/101.544447

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

[No abstract available]

引用

页码：19 / &

页数：7

共 12 条

[1]

[Anonymous], IEEE COMPUTER

[2]

Bhavnagarwala AJ, 1996, 1996 INTERNATIONAL SYMPOSIUM ON LOW POWER ELECTRONICS AND DESIGN - DIGEST OF TECHNICAL PAPERS, P193, DOI 10.1109/LPE.1996.547505

[3] Optimal low power interconnect networks [J].

Davis, JA ;

De, V ;

Meindl, J .

1996 SYMPOSIUM ON VLSI TECHNOLOGY: DIGEST OF TECHNICAL PAPERS, 1996, :78-79

[4]

DE VK, 1996, DIG VLSI TECH S, P198

[5] PHYSICAL LIMITS IN DIGITAL ELECTRONICS [J].

KEYES, RW .

PROCEEDINGS OF THE IEEE, 1975, 63 (05) :740-767

[6] EFFECT OF RANDOMNESS IN DISTRIBUTION OF IMPURITY ATOMS ON FET THRESHOLDS [J].

KEYES, RW .

APPLIED PHYSICS, 1975, 8 (03) :251-259

[7] EVOLUTION OF DIGITAL ELECTRONICS TOWARDS VLSI [J].

KEYES, RW .

IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1979, 14 (02) :193-201

[8]

Meindl J. D., 1983, International Electron Devices Meeting 1983. Technical Digest, P8

[9] LOW-POWER MICROELECTRONICS - RETROSPECT AND PROSPECT [J].

MEINDL, JD .

PROCEEDINGS OF THE IEEE, 1995, 83 (04) :619-635

[10]

OHMI T, 1994, INT C ADV MICR DEV P, P3

← 1 2 →