Conservative and dissipative force imaging of switchable rotaxanes with frequency-modulation atomic force microscopy

被引:21
作者
Farrell, AA [1 ]
Fukuma, T
Uchihashi, T
Kay, ER
Bottari, G
Leigh, DA
Yamada, H
Jarvis, SP
机构
[1] Univ Dublin Trinity Coll, Ctr Res Adapt Nanostruct & Nanodevices, Nanoscale Funct Grp, Dublin 2, Ireland
[2] Kyoto Univ A1 326, Dept Elect Sci & Engn, Nishikyo Ku, Kyoto 6158510, Japan
[3] Univ Edinburgh, Sch Chem, Edinburgh EH9 3JJ, Midlothian, Scotland
关键词
D O I
10.1103/PhysRevB.72.125430
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We compare constant amplitude frequency modulation atomic force microscopy (FM-AFM) in ambient conditions to ultrahigh vacuum (UHV) experiments by analysis of thin films of rotaxane molecules. Working in ambient conditions is important for the development of real-world molecular devices. We show that the FM-AFM technique allows quantitative measurement of conservative and dissipative forces without instabilities caused by any native water layer. Molecular resolution is achieved despite the low Q-factor in the air. Furthermore, contrast in the energy dissipation is observed even at the molecular level. This should allow investigations into stimuli-induced sub-molecular motion of organic films.
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页数:6
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