Studying the local chemical environment of sulfur atoms at buried interfaces in CdS/ZnSe superlattices

被引：10

作者：

Heske, C

Groh, U

Fuchs, O

Weinhardt, L

Umbach, E

Grün, M

Petillon, S

Dinger, A

Klingshirn, C

Szuszkiewicz, W

Fleszar, A

机构：

[1] Univ Wurzburg, D-97074 Wurzburg, Germany

[2] Univ Karlsruhe, Inst Angew Phys, D-76128 Karlsruhe, Germany

[3] Polish Acad Sci, Inst Phys, PL-02668 Warsaw, Poland

来源：

APPLIED PHYSICS LETTERS | 2003年 / 83卷 / 12期

关键词：

D O I：

10.1063/1.1609235

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Soft x-ray emission spectroscopy has been employed to study the local chemical environment of sulfur atoms in sulfide II-VI semiconductors (ZnS, CdS, HgS) and CdS/ZnSe superlattices. By using fluorescence transitions involving metal d-state-derived valence bands and S 2p core holes, a distinction between S-Zn and S-Cd bonds in the superlattices can be made. We find that, in addition to the expected S-Cd bonds, interfacial S-Zn bonds are present in superlattices grown at 170 degreesC, and that the amount of S-Zn bonds significantly increases for growth at 300 degreesC due to interface intermixing. (C) 2003 American Institute of Physics.

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页码：2360 / 2362

页数：3

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