Positional dependence of optical absorption in silicon nanostructure

被引:7
作者
Nishio, K [1 ]
Koga, J
Ohtani, H
Yamaguchi, T
Yonezawa, F
机构
[1] Keio Univ, Dept Phys, Yokohama, Kanagawa 2238522, Japan
[2] Natl Inst Fus Sci, Theory & Comp Simulat Ctr, Toki 5095292, Japan
[3] Tokyo Womens Med Univ, Dept Phys, Tokyo 1628666, Japan
关键词
D O I
10.1016/S0022-3093(01)00849-3
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We present a theoretical study of the optical absorption process of a 9 x 9 Si quantum wire. We calculate the imaginary part of the dielectric constant epsilon (2) and the contribution to epsilon (2) due to three Si atoms located in different positions using the non-orthogonal tight-binding method. From these calculations, we clearly find for the first time that the optical absorption below 3.4 eV tends to occur in the inner region of the 9 x 9 Si quantum wire. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:705 / 708
页数:4
相关论文
共 14 条
[1]   IDENTIFICATION OF RADIATIVE TRANSITIONS IN HIGHLY POROUS SILICON [J].
CALCOTT, PDJ ;
NASH, KJ ;
CANHAM, LT ;
KANE, MJ ;
BRUMHEAD, D .
JOURNAL OF PHYSICS-CONDENSED MATTER, 1993, 5 (07) :L91-L98
[2]   SILICON QUANTUM WIRE ARRAY FABRICATION BY ELECTROCHEMICAL AND CHEMICAL DISSOLUTION OF WAFERS [J].
CANHAM, LT .
APPLIED PHYSICS LETTERS, 1990, 57 (10) :1046-1048
[3]  
Cruz M, 1997, MATER RES SOC SYMP P, V452, P69
[4]   SIZE DEPENDENCE OF BAND-GAPS IN SILICON NANOSTRUCTURES [J].
DELLEY, B ;
STEIGMEIER, EF .
APPLIED PHYSICS LETTERS, 1995, 67 (16) :2370-2372
[5]   MICROSTRUCTURE AND OPTICAL-PROPERTIES OF FREESTANDING POROUS SILICON FILMS - SIZE DEPENDENCE OF ABSORPTION-SPECTRA IN SI NANOMETER-SIZED CRYSTALLITES [J].
KANEMITSU, Y ;
UTO, H ;
MASUMOTO, Y ;
MATSUMOTO, T ;
FUTAGI, T ;
MIMURA, H .
PHYSICAL REVIEW B, 1993, 48 (04) :2827-2830
[6]   Photoluminescence mechanism in surface-oxidized silicon nanocrystals [J].
Kanemitsu, Y ;
Okamoto, S ;
Otobe, M ;
Oda, S .
PHYSICAL REVIEW B, 1997, 55 (12) :R7375-R7378
[7]   THE LUMINESCENCE OF POROUS SI - THE CASE FOR THE SURFACE-STATE MECHANISM [J].
KOCH, F ;
PETROVAKOCH, V ;
MUSCHIK, T .
JOURNAL OF LUMINESCENCE, 1993, 57 (1-6) :271-281
[8]   OPTICAL CHARACTERIZATION OF POROUS SILICON BY SYNCHROTRON-RADIATION REFLECTANCE SPECTRA ANALYSES [J].
KOSHIDA, N ;
KOYAMA, H ;
SUDA, Y ;
YAMAMOTO, Y ;
ARAKI, M ;
SAITO, T ;
SATO, K ;
SATA, N ;
SHIN, S .
APPLIED PHYSICS LETTERS, 1993, 63 (20) :2774-2776
[9]   OPTICAL-PROPERTIES OF POROUS SILICON [J].
LOCKWOOD, DJ .
SOLID STATE COMMUNICATIONS, 1994, 92 (1-2) :101-112
[10]   ELECTRONIC STACKING-FAULT STATES IN SILICON [J].
MATTHEISS, LF ;
PATEL, JR .
PHYSICAL REVIEW B, 1981, 23 (10) :5384-5396