Widely tunable electrooptic pulse-pattern generation and its application to on-wafer large-signal characterization of ultra high-speed electronic devices

被引：9

作者：

Otsuji, T ^{[1
]}

Nagatsuma, T ^{[1
]}

Kato, K ^{[1
]}

Yoneyama, M ^{[1
]}

机构：

[1] NIPPON TELEGRAPH & TEL PUBL CORP, OPTOELECTR LABS, ATSUGI, KANAGAWA 24301, JAPAN

来源：

OPTICAL AND QUANTUM ELECTRONICS | 1996年 / 28卷 / 07期

关键词：

D O I：

10.1007/BF00820164

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A pulse-rate-tunable, electrooptic pulse-pattern generator and a wideband high-efficiency optical-to-electrical (OE) conversion stimulus probe have been developed. Sinusoidal electrooptic amplitude/phase modulation and chirp compensation were used to provide picosecond pulsation, and the relationship between pulse-rate tunability and the extinction ratio has been studied analytically and experimentally. Return-to-zero (RZ) pulse patterns of 10-72 Gb s(-1) have been generated by using LiNbO3 amplitude/phase modulators with a bandwidth of 18 GHz, a single dispersion shifted fibre, and a time-division multiplexer. A 1.55 mu m waveguide p-i-n photodiode yielded high responsivity (0.75 A W-1) and a saturation peak voltage of 200 mV at the probe tip. The measured effective 3 dB bandwidth exceeds 50 GHz, which is currently limited by the frequency dispersion of the coplaner waveguide (CPW) used in the probe. Use of this generator and probe, in combination with electrooptic sampling, for on-wafer characterization of a broadband distributed amplifier revealed the amplifier's saturation characteristics and waveform distortion under actual operating conditions with a 64 Gb s(-1), 120 mV per probe, RZ pulse-pattern input.

引用

页码：991 / 1005

页数：15

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