Tilted fiber texture in aluminum nitride thin films

被引:16
作者
Deniz, D. [1 ]
Harper, J. M. E.
Hoehn, J. W.
Chen, F.
机构
[1] Univ New Hampshire, Dept Phys, Durham, NH 03824 USA
[2] Seagate Technol Inc, Bloomington, MN 55435 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 2007年 / 25卷 / 04期
基金
美国国家科学基金会;
关键词
D O I
10.1116/1.2712190
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The authors report a strong dependence of fiber texture tilt angle on the gas composition in aluminum nitride (AIN) thin films prepared by off-normal reactive magnetron sputtering in N-2/Ar mixtures. Using x-ray pole figures, they measured the c-axis AIN tilt angle as a function of N-2 flow ratio for a deposition angle of 42 degrees from normal. They found that the c axis remains perpendicular to the substrate for a N-2 flow ratio up to 12%-15% and then abruptly shifts towards the deposition direction for a N-2 flow ratio above 12%-15%. They also identified a range of deposition parameters at lower N-2 flow in which an amorphous phase of AIN is formed. The authors attribute the tilted fiber texture to the energetic atom flux causing less damage and resputtering in grains oriented with open channeling directions, compared with nonchanneling directions in AIN. The abrupt change in fiber tilt angle versus gas composition is attributed to the adatom mobility being quenched above 12%-15% N-2 flow. (c) 2007 American Vacuum Society.
引用
收藏
页码:1214 / 1218
页数:5
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