Numerical analysis of InGaN dot-like structure and compositional fluctuation caused by phase separation: comparison with experiment

被引:9
作者
Okumura, T [1 ]
Akagi, Y [1 ]
机构
[1] Sharp Corp, Adv Technol Res Labs, Tenri, Nara 6328567, Japan
关键词
computer simulation; phase separation; nitrides; laser diodes; light emitting diodes;
D O I
10.1016/S0022-0248(00)00993-3
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
We studied numerically the details of In compositional fluctuations and a spontaneous formation of a dot-like structure of InGaN alloy semiconductor due to phase separation by using the cell dynamical system (CDS) approach focusing on the details of the stage of time-evolution of phase separation. The numerical results in this work resemble the experimental results on inhomogeneouos alloying of InGaN reported so far and in addition predict the diffusion which previous experiments could not determine quantitatively. The In-rich regions with a dot-like structure appearing in InGaN-based multi-quantum-well (MQW) laser diodes (LDs) with their emission wavelength below 450nm are composed of InGaN showing small spatial fluctuations of In composition formed at an early stage of phase separation. The large blueshift of the static electroluminescence (EL) peak observed in blue and green InGaN-based single-quantum-well (SQW) light-emitting diodes (LEDs) above 450nm also relates to the large spatial fluctuations of In composition grown at an early stage of phase separation. For the higher In composition corresponding to the emission wavelength longer than 450 nm, the time-evolution of phase separation proceeds rapidly, indicating the large In compositional fluctuation and thus the large blueshift. In order to obtain a spatially uniform In composition, we should realize a uniform distribution of In composition during the growth of InGaN layer before phase separation proceeds. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:43 / 54
页数:12
相关论文
共 19 条
[1]   Spatially resolved cathodoluminescence spectra of InGaN quantum wells [J].
Chichibu, S ;
Wada, K ;
Nakamura, S .
APPLIED PHYSICS LETTERS, 1997, 71 (16) :2346-2348
[2]   Spontaneous emission of localized excitons in InGaN single and multiquantum well structures [J].
Chichibu, S ;
Azuhata, T ;
Sota, T ;
Nakamura, S .
APPLIED PHYSICS LETTERS, 1996, 69 (27) :4188-4190
[3]   Near-field scanning optical spectroscopy of an InGaN quantum well [J].
Crowell, PA ;
Young, DK ;
Keller, S ;
Hu, EL ;
Awschalom, DD .
APPLIED PHYSICS LETTERS, 1998, 72 (08) :927-929
[4]   Band-tail model and temperature-induced blue-shift in photoluminescence spectra of InxGa1-xN grown on sapphire [J].
Eliseev, PG ;
Osinski, M ;
Lee, JY ;
Sugahara, T ;
Sakai, S .
JOURNAL OF ELECTRONIC MATERIALS, 2000, 29 (03) :332-341
[5]   Solid phase immiscibility in GaInN [J].
Ho, IH ;
Stringfellow, GB .
APPLIED PHYSICS LETTERS, 1996, 69 (18) :2701-2703
[6]   Growth and properties of InGaN nanoscale islands on GaN [J].
Keller, S ;
Keller, BP ;
Minsky, MS ;
Bowers, JE ;
Mishra, UK ;
DenBaars, SP ;
Seifert, W .
JOURNAL OF CRYSTAL GROWTH, 1998, 189 :29-32
[7]   Narrow photoluminescence peaks from localized states in InGaN quantum dot structures [J].
Moriwaki, O ;
Someya, T ;
Tachibana, K ;
Ishida, S ;
Arakawa, Y .
APPLIED PHYSICS LETTERS, 2000, 76 (17) :2361-2363
[8]   Characteristics of InGaN-based UV/blue/green/amber/red light-emitting diodes [J].
Mukai, T ;
Yamada, M ;
Nakamura, S .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1999, 38 (7A) :3976-3981
[9]  
NAKAMURA S, 2000, JPN SOC APPL PHYS IN, V1, P5
[10]   Role of self-formed InGaN quantum dots for exciton localization in the purple laser diode emitting at 420 nm [J].
Narukawa, Y ;
Kawakami, Y ;
Funato, M ;
Fujita, S ;
Fujita, S ;
Nakamura, S .
APPLIED PHYSICS LETTERS, 1997, 70 (08) :981-983