Low-temperature STM on InAs(110) accumulation surfaces

被引:16
作者
Canali, L
Wildoer, JWG
Kerkhof, O
Kouwenhoven, LP
机构
[1] Delft Univ Technol, Dept Appl Phys, NL-2628 CJ Delft, Netherlands
[2] Delft Univ Technol, DIMES, NL-2628 CJ Delft, Netherlands
来源
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1998年 / 66卷 / Suppl 1期
关键词
D O I
10.1007/s003390051111
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The properties of InAs(110) surfaces have been investigated by means of low-temperature scanning tunneling microscopy and spectroscopy. A technique for ex-situ sulphur passivation has been developed to form an accumulation layer on such a surface. Tunneling spectroscopy at 4.2 K shows the presence of 2D subbands in the accumulation layer. Measurements in high magnetic field demonstrate Landau quantization of the energy spectrum, both in the 2D subbands and in the 3D bulk conduction band.
引用
收藏
页码:S113 / S116
页数:4
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