On-state reliability of solid-electrolyte switch

被引：19

作者：

Banno, N. ^{[1
]}

Sakamoto, T. ^{[1
]}

Fujieda, S. ^{[1
]}

Aono, M. ^{[2
]}

机构：

[1] NEC Corp Ltd, Device Platforms Res Labs, Kanagawa 2291198, Japan

[2] Natl Inst Mat Sci, WPI Mat Nanoarchitecton, Tsukuba, Ibaraki 3050003, Japan

来源：

2008 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS - 46TH ANNUAL | 2008年

关键词：

D O I：

10.1109/RELPHY.2008.4558999

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

080906 [电磁信息功能材料与结构]; 082806 [农业信息与电气工程];

摘要：

We examined the ON-state reliability of a solid electrolyte resistive switch, named "NanoBridge", for programmable logic application. We found a trade-off between turn-off current and ON-state reliability and optimized the ON conductance. Through this optimization, we obtained high durability against DC current of similar to 0.2mA at 105 degrees C for 10 years and low turn-off current less than 5mA. NanoBridge can thus meet the requirements for programmable logic applications.

引用

页码：707 / +

页数：2

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