Carbon contamination of soft X-ray beamlines: dramatic anti-reflection coating effects observed in the 1 keV photon energy region

被引：35

作者：

Chauvet, C. ^{[1
]}

Polack, F. ^{[1
]}

Silly, M. G. ^{[1
]}

Lagarde, B. ^{[1
]}

Thomasset, M. ^{[1
]}

Kubsky, S. ^{[1
]}

Duval, J. P. ^{[1
]}

Risterucci, P. ^{[1
]}

Pilette, B. ^{[1
]}

Yao, I. ^{[1
]}

Bergeard, N. ^{[1
]}

Sirotti, F. ^{[1
]}

机构：

[1] LOrme Merisiers, Synchrotron Soleil, F-91193 Gif Sur Yvette, France

来源：

JOURNAL OF SYNCHROTRON RADIATION | 2011年 / 18卷

关键词：

carbon contamination; beamline optics; X-ray reflectivity; optical thin film; SYNCHROTRON-RADIATION; EFFICIENCY; SURFACES; GRATINGS;

D O I：

10.1107/S0909049511023119

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Carbon contamination is a general problem of under-vacuum optics submitted to high fluence. In soft X-ray beamlines carbon deposit on optics is known to absorb and scatter radiation close to the C K-edge (280 eV), forbidding effective measurements in this spectral region. Here the observation of strong reflectivity losses is reported related to carbon deposition at much higher energies around 1000 eV, where carbon absorptivity is small. It is shown that the observed effect can be modelled as a destructive interference from a homogeneous carbon thin film.

引用

页码：761 / 764

页数：4

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