Femtosecond time-resolved dielectric function measurements by dual-angle reflectometry

被引：35

作者：

Roeser, CAD

Kim, AMT

Callan, JP

Huang, L

Glezer, EN

Siegal, Y

Mazur, E

机构：

[1] Harvard Univ, Div Engn & Appl Sci, Cambridge, MA 02138 USA

[2] Harvard Univ, Dept Phys, Cambridge, MA 02138 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2003年 / 74卷 / 07期

关键词：

D O I：

10.1063/1.1582383

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We present a technique to measure the dielectric function of a material with femtosecond time resolution over a broad photon energy range. The absolute reflectivity is measured at two angles of incidence, and epsilon(omega) is calculated by numerical inversion of Fresnel-like formulas. Using white-light generation, the single-color probe is broadened from the near IR to the near UV, but femtosecond time resolution is maintained. Calibration of the apparatus and error analysis are discussed. Finally, measurements of isotropic, thin film, and uniaxial materials are presented and compared to reflectivity-only studies to illustrate the merit of the technique. (C) 2003 American Institute of Physics.

引用

收藏

页码：3413 / 3422

页数：10

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