Nanofabrication

被引:134
作者
Marrian, CRK
Tennant, DM
机构
[1] IBM Corp, Almaden Res Ctr, San Jose, CA 95120 USA
[2] New Jersey Nanotechnol Consortium, Murray Hill, NJ 07974 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 2003年 / 21卷 / 05期
关键词
D O I
10.1116/1.1600446
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In this the 50th anniversary year of the AVS and the AVS Symposium, this article is offered as one in a series of topical review articles to celebrate the role of this community to the progress in nanofabrication technology. The emphasis of the article is on the principles and limits of the various pattern formation techniques which have emerged as important tools in the research of nanoscale devices and structures. Topics such as e-beam lithography, proximal probes, imprint lithography, self assembly, and directed assembly are all discussed. (C) 2003 American Vacuum Society.
引用
收藏
页码:S207 / S215
页数:9
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