Band gaps and band offsets in strained GaAs1-ySby on InP grown by metalorganic chemical vapor deposition

被引:77
作者
Peter, M [1 ]
Herres, N [1 ]
Fuchs, F [1 ]
Winkler, K [1 ]
Bachem, KH [1 ]
Wagner, J [1 ]
机构
[1] Fraunhofer Inst Appl Solid State Phys, D-79108 Freiburg, Germany
关键词
D O I
10.1063/1.123044
中图分类号
O59 [应用物理学];
学科分类号
摘要
Metastable GaAs1-ySby with 0.22 <y<0.70 has been grown pseudomorphically strained on (001) InP substrates using metalorganic chemical vapor deposition. The Sb concentration and layer thicknesses, ranging from 24 to 136 nm, were determined by high resolution x-ray diffraction (HRXRD) measurements. Low-temperature photoluminescence (PL) spectroscopy revealed spatially indirect band-to-band emission of electrons localized in the InP and holes in the GaAs1-ySby. At increased excitation power densities samples with layer thicknesses above 65 nm showed, also, spatially direct PL across the band gap of the strained GaAs1-ySby. From the PL data the band gap energy and the band offsets of GaAs1-ySby relative to InP were derived and compared with the predictions of the Model Solid Theory. (C) 1999 American Institute of Physics. [S0003-6951(99)04203-5].
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页码:410 / 412
页数:3
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