Combinatorial approach for ferroelectric material libraries prepared by liquid source misted chemical deposition method

被引:17
作者
Kim, Ki Woong
Jeon, Min Ku
Oh, Kwang Seok
Kim, Tai Suk
Kim, Yun Seok
Woo, Seong Ihl
机构
[1] Korea Adv Inst Sci & Technol, Dept Chem & Biomol Engn, Taejon 305701, South Korea
[2] Korea Adv Inst Sci & Technol, Ctr Ultramicrochem Proc Syst, Taejon 305701, South Korea
[3] Korea Adv Inst Sci & Technol, Dept Mat Sci & Engn, Taejon 305701, South Korea
关键词
BLCT thin film array; microbeam x-ray diffraction; scanning probe microscope;
D O I
10.1073/pnas.0610146104
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Combinatorial approach for discovering novel functional materials in the huge diversity of chemical composition and processing conditions has become more important for breakthrough in thin film electronic and energy-conversion devices. The efficiency of combinatorial method depends on the preparation of a reliable high-density composition thin-film library. The physico-chemical properties of each sample on the library should be similar to those of the corresponding samples prepared by one-by-one conventional methods. We successfully developed the combinatorial liquid source misted chemical deposition (LSMCD) method and demonstrated its validity in screening the chemical composition of Bi3.75LaxCe0.25-xTi3O12 (BLCT) for high remanent polarization (P-r). LSMCD is a cheap promising combinatorial screening tool. It can control the composition up to ppm level and produce homogeneous multicomponent library. LSMCD method allows us to prepare BLCT thin-film library at the variation of 0.4 mol% of La. Maximum 2P(r) is 35 mu C/Cm-2 at x = 0.21. The intensity of (117) XRD peak is quantitatively related to 2P(r). Newly developed scanning piezoelectric deformation measurement for nano-sized samples using scanning probe microscope (SPM) is also found out to be reliable for determining the relative ranking Of Pr value rapidly.
引用
收藏
页码:1134 / 1139
页数:6
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