Fiber interferometer-based variable temperature scanning force microscope

被引:27
作者
Euler, R [1 ]
Memmert, U [1 ]
Hartmann, U [1 ]
机构
[1] UNIV SAARLAND,INST EXPT PHYS,D-66041 SAARBRUCKEN,GERMANY
关键词
D O I
10.1063/1.1147992
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A scanning force microscope designed for an operation at temperatures between 4.2 and 300 K is presented. The deflection of the microfabricated force sensing cantilever is detected via an optical fiber interferometer, For low temperature imaging the whole instrument is incorporated into a bath cryostat which is suitable for both liquid helium and liquid nitrogen cooling. The instrument is of highly symmetric design in order to avoid large inner misalignment of the interferometer due to thermal expansion/contraction during temperature changes. In addition to this thermally compensated design, the interferometer can be adjusted by piezo-actuators in situ in three dimensions. (C) 1997 American Institute of Physics.
引用
收藏
页码:1776 / 1778
页数:3
相关论文
共 14 条
  • [1] LOW-TEMPERATURE FORCE MICROSCOPE WITH ALL-FIBER INTERFEROMETER
    ALBRECHT, TR
    GRUTTER, P
    RUGAR, D
    SMITH, DPE
    [J]. ULTRAMICROSCOPY, 1992, 42 : 1638 - 1646
  • [2] AN EASILY OPERABLE SCANNING TUNNELING MICROSCOPE
    BESOCKE, K
    [J]. SURFACE SCIENCE, 1987, 181 (1-2) : 145 - 153
  • [3] VARIABLE-TEMPERATURE ULTRAHIGH-VACUUM ATOMIC-FORCE MICROSCOPE
    DAI, Q
    VOLLMER, R
    CARPICK, RW
    OGLETREE, DF
    SALMERON, M
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (11) : 5266 - 5271
  • [4] POSITIONING SINGLE ATOMS WITH A SCANNING TUNNELING MICROSCOPE
    EIGLER, DM
    SCHWEIZER, EK
    [J]. NATURE, 1990, 344 (6266) : 524 - 526
  • [5] A LOW-TEMPERATURE ATOMIC FORCE SCANNING TUNNELING MICROSCOPE FOR ULTRAHIGH-VACUUM
    GIESSIBL, FJ
    GERBER, C
    BINNIG, G
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02): : 984 - 988
  • [6] SCANNING PROBE MICROSCOPY ON SUPERCONDUCTORS - ACHIEVEMENTS AND CHALLENGES
    HARTMANN, U
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1994, 59 (01): : 41 - 48
  • [7] LOW-TEMPERATURE MAGNETIC FORCE MICROSCOPY
    HUG, HJ
    MOSER, A
    JUNG, T
    FRITZ, O
    WADAS, A
    PARASHIKOV, I
    GUNTHERODT, HJ
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1993, 64 (10) : 2920 - 2925
  • [8] LOW-TEMPERATURE ATOMIC FORCE MICROSCOPY
    KIRK, MD
    ALBRECHT, TR
    QUATE, CF
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (06) : 833 - 835
  • [9] OBSERVATION OF SURFACE RECONSTRUCTION ON SILICON ABOVE 800-DEGREES-C USING THE STM
    KITAMURA, S
    SATO, T
    IWATSUKI, M
    [J]. NATURE, 1991, 351 (6323) : 215 - 217
  • [10] VARIABLE-TEMPERATURE SCANNING TUNNELING MICROSCOPE
    LYDING, JW
    SKALA, S
    HUBACEK, JS
    BROCKENBROUGH, R
    GAMMIE, G
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (09) : 1897 - 1902