Tuning the electrical property via defect engineering of single layer MoS2 by oxygen plasma

被引:220
作者
Islam, Muhammad R. [1 ,2 ]
Kang, Narae [1 ,2 ]
Bhanu, Udai [1 ,2 ]
Paudel, Hari P. [1 ,2 ]
Erementchouk, Mikhail [1 ,2 ]
Tetard, Laurene [1 ,2 ]
Leuenberger, Michael N. [1 ,2 ,4 ]
Khondaker, Saiful I. [1 ,2 ,3 ]
机构
[1] Univ Cent Florida, Nanosci Technol Ctr, Orlando, FL 32826 USA
[2] Univ Cent Florida, Dept Phys, Orlando, FL 32826 USA
[3] Univ Cent Florida, Sch Elect Engn & Comp Sci, Orlando, FL 32826 USA
[4] Univ Cent Florida, Coll Opt & Photonis CREOL, Orlando, FL 32826 USA
基金
美国国家科学基金会;
关键词
ELECTRONIC-STRUCTURE; INTEGRATED-CIRCUITS; TRANSITION; RAMAN; INSULATOR; STRAIN; OXIDE; XPS;
D O I
10.1039/c4nr02142h
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
We have demonstrated that the electrical property of single-layer molybdenum disulfide (MoS2) can be significantly tuned from the semiconducting to the insulating regime via controlled exposure to oxygen plasma. The mobility, on-current and resistance of single-layer MoS2 devices were varied by up to four orders of magnitude by controlling the plasma exposure time. Raman spectroscopy, X-ray photoelectron spectroscopy and density functional theory studies suggest that the significant variation of electronic properties is caused by the creation of insulating MoO3-rich disordered domains in the MoS2 sheet upon oxygen plasma exposure, leading to an exponential variation of resistance and mobility as a function of plasma exposure time. The resistance variation calculated using an effective medium model is in excellent agreement with the measurements. The simple approach described here can be used for the fabrication of tunable two-dimensional nanodevices based on MoS2 and other transition metal dichalcogenides.
引用
收藏
页码:10033 / 10039
页数:7
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