Atomic structure of the steps on Si(001) studied by scanning tunneling microscopy

被引:16
作者
Komura, T [1 ]
Yoshimura, M [1 ]
Yao, T [1 ]
机构
[1] TOHOKU UNIV,INST MAT RES,AOBA KU,SENDAI,MIYAGI 980,JAPAN
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1996年 / 14卷 / 02期
关键词
D O I
10.1116/1.589172
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have studied atomic structures of the steps on Si(001) surface, using scanning tunneling microscopy. Freezing of dimer buckling on an upper terrace near the S-A steps is clearly observed, which also affects atomic arrangements near the step. Both types of the rebonded and the nonrebonded S-B steps are observed. The scanning tunneling microscopy image of the rebonded S-B step shows a characteristic feature in which two markedly bright spots are observed in the empty state, It is found that one bright protrusion corresponds to the dimer at the end of the upper terrace, and another corresponds to the rebonded atoms at the lower terrace. The feature might be related to the lattice strain and the charge transfer by the rebonding. (C) 1996 Vacuum Society.
引用
收藏
页码:906 / 908
页数:3
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