Surface and Interference Coenhanced Raman Scattering of Graphene

被引：81

作者：

Gao, Libo ^{[1
]}

Ren, Wencai ^{[1
]}

Liu, Bilu ^{[1
]}

Saito, Riichiro ^{[2
]}

Wu, Zhong-Shuai ^{[1
]}

Li, Shisheng ^{[1
]}

Jiang, Chuanbin ^{[1
]}

Li, Feng ^{[1
]}

Cheng, Hui-Ming ^{[1
]}

机构：

[1] Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China

[2] Tohoku Univ, Dept Phys, Sendai, Miyagi 9808578, Japan

来源：

ACS NANO | 2009年 / 3卷 / 04期

基金：

美国国家科学基金会;

关键词：

graphene; Raman scattering; surface; interference; enhancement; SPECTROSCOPY; GRAPHITE; DISORDER; LAYER; GAS;

D O I：

10.1021/nn8008799

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

We propose a novel surface and interference coenhanced Raman scattering technique to dramatically enhance the Raman signal intensity of graphene by using a specifically designed substrate of Si capped with surface-active metal and oxide double layers (SMO). The total enhancement ratio can reach the order of 10(3) compared with the original Si substrate. Combining the visibility of graphene on the SMO substrate, we demonstrate that the tiny structure change and surface structure of grapheme can be easily detected. This technique makes Raman spectroscopy a more powerful tool in the field of ultrasensitive characterization of graphene, isolated carbon nanotubes, and other film-like materials.

引用

页码：933 / 939

页数：7

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