Optimization of synthesis of the solid solution, Pb(Zr1-xTix)O3 on a single substrate using a high-throughput modified molecular-beam epitaxy technique

被引:5
作者
Anderson, P. S. [2 ]
Guerin, S. [2 ]
Hayden, B. E. [3 ]
Han, Y. [1 ]
Pasha, M. [1 ]
Whittle, K. R. [1 ]
Reaney, I. M. [1 ]
机构
[1] Univ Sheffield, Dept Mat Engn, Sheffield S1 3JD, S Yorkshire, England
[2] Univ Southampton, Ilika Technol Ltd, Southampton SO16 7NS, Hants, England
[3] Univ Southampton, Sch Chem, Southampton SO17 1BJ, Hants, England
关键词
TITANATE THIN-FILMS; ELECTRICAL-PROPERTIES; GEL ROUTE; PZT; DEPOSITION; OXIDE; CRYSTALLIZATION; ORIENTATION; MICROSCOPY;
D O I
10.1557/JMR.2009.0008
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Synthesis of Pb(Zr1-xTix)O-3 (PZT) on a single substrate using a high-throughput molecular-beam epitaxy technique was demonstrated. In situ synthesis of crystalline PZT at elevated substrate temperatures could not be achieved, as reevaporation of Pb (PbO) occurred and the partial pressure of O-2 was insufficient to prevent formation of a PbPtx phase during deposition. Instead, ex situ postdeposition annealing was performed on PZT deposited at room temperature. Dense single phase PZT was prepared with a compositional range of 0.1 > x > 0.9, for film thicknesses up to 800 nm. Transmission electron microscopy revealed the grain size increased from 50 nm to similar to 0.5 mu m with increasing Zr-concentration and became more columnar. Raman, x-ray diffraction. and scanning electron microscopy/energy dispersive spectroscopy results revealed a morphotropic phase boundary between rhombohedral and tetragonal phases occurred at x similar to 0.4 rather than at x = 0.47 in bulk ceramics. This was attributed to clamping arising from mismatch in thermal expansion between the film and substrate.
引用
收藏
页码:164 / 172
页数:9
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