Quadraxial probe for high resolution near-field scanning rf/microwave microscopy

被引：11

作者：

Karbassi, A. ^{[1
]}

Paulson, C. A. ^{[1
]}

Kozyrev, A. B. ^{[1
]}

Banerjee, M. ^{[1
]}

Wang, Y. ^{[1
]}

van der Weide, D. W. ^{[1
]}

机构：

[1] Univ Wisconsin, Dept Elect & Comp Engn, Madison, WI 53706 USA

来源：

APPLIED PHYSICS LETTERS | 2006年 / 89卷 / 15期

关键词：

D O I：

10.1063/1.2358945

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The authors propose and demonstrate a miniaturized quadraxial probe that employs a differential feed technique for use in near-field rf/microwave transmission microscopy. Their quadraxial probe's electric field measurements show higher electric field localization than a conventional coaxial (monopole) probe. The improved spatial resolution and more sensitive phase measurement of the quadraxial probe versus coaxial probe are further validated by a metal line scan experiment. (c) 2006 American Institute of Physics.

引用

页数：3

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