Polarization Phenomena in TlBr Detectors

被引：64

作者：

Hitomi, Keitaro ^{[1
]}

Kikuchi, Yohei ^{[2
]}

Shoji, Tadayoshi ^{[1
]}

Ishii, Keizo ^{[2
]}

机构：

[1] Tohoku Inst Technol, Dept Elect & Intelligent Syst, Sendai, Miyagi 9828577, Japan

[2] Tohoku Univ, Dept Quantum Sci & Energy Engn, Sendai, Miyagi 9808579, Japan

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2009年 / 56卷 / 04期

关键词：

Gamma-ray detectors; semiconductor detectors; NUCLEAR RADIATION DETECTORS; X-RAY SPECTROSCOPY; PERFORMANCE; CRYSTALS;

D O I：

10.1109/TNS.2009.2013349

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A comparison of long-term stabilities of TlBr detectors with Au and Tl electrodes was performed in this study, in order to reveal polarization phenomena in TlBr detectors. Au/TlBr/Au detectors exhibited polarization phenomena at room temperature, observed as degradation of spectral performance and reduction of leakage current with elapsed time. Applying reverse bias voltage to the detectors recovered the detector performance temporarily. No polarization phenomena were observed in Tl/TlBr/Tl detectors at room temperature. The detector exhibited stable spectral performance for 24 hours.

引用

收藏

页码：1859 / 1862

页数：4

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