Pixellated TlBr detectors with the depth sensing technique

被引：24

作者：

Hitomi, Keitaro ^{[1
]}

Onodera, Toshiyuki

Shoji, Tadayoshi

He, Zhong

机构：

[1] Tohoku Inst Technol, Dept Elect, Sendai, Miyagi 9828577, Japan

[2] Univ Michigan, Dept Nucl Engn & Radiol Sci, Ann Arbor, MI 48109 USA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2007年 / 578卷 / 01期

关键词：

thallium bromide; semiconductor detectors; position-sensitive detectors;

D O I：

10.1016/j.nima.2007.05.113

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The depth sensing technique has been introduced to a 1.8 mm thick pixellated thalliurn bromide (TlBr) detector in order to enhance the performance of the device. Significant improvement of the energy resolution has been achieved with the device. An energy resolution of 2% FWHM at 662keV was recorded with the device after the depth correction and rejection. (c) 2007 Elsevier B.V. All rights reserved.

引用

收藏

页码：235 / 238

页数：4

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