Nanotribological behavior of C60 films at an extremely low load

被引：23

作者：

Okita, S ^{[1
]}

Ishikawa, M ^{[1
]}

Miura, K ^{[1
]}

机构：

[1] Aichi Univ Educ, Dept Phys, Kariya, Aichi 448, Japan

来源：

SURFACE SCIENCE | 1999年 / 442卷 / 01期

关键词：

atomic force microscopy (AFM); friction; fullerenes; lubrication; tribology;

D O I：

10.1016/S0039-6028(99)00818-3

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We have studied the nanotribological behavior of C-60 films formed on a KCl(001) surface at an extremely low load, using scanning force microscopy (SFM). It has been observed that the SFM tip undergoes molecularly resolved stick-slip motion depending on scanning direction. The frictional force at the relative humidity (RH) of 20% is about a quarter that in dry argon. The decrease in frictional force at 20% RH comes from the lower stiffness of the tip-sample contact, indicating the mobility of C-60 molecules, such as rolling and/or translation due to water adsorption. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：L959 / L963

页数：5

共 6 条

[1] Lateral stiffness: A new nanomechanical measurement for the determination of shear strengths with friction force microscopy [J].