GaN-MOVPE growth and its microscopic chemistry of gaseous phase by computational thermodynamic analysis

被引:23
作者
Hirako, A
Yoshitani, M
Nishibayashi, M
Nishikawa, Y
Ohkawa, K
机构
[1] Sci Univ Tokyo, Dept Appl Phys, Fac Sci, Shinjuku Ku, Tokyo 1628601, Japan
[2] Japan Sci & Technol Corp, Exploratory Res Adv Technol, Gonokami Cooperat Excitat Project, Shinjuku Ku, Tokyo 1628601, Japan
关键词
computer simulation; metalorganic vapor phase epitaxy; nitrides; semiconducting; III-V materials;
D O I
10.1016/S0022-0248(01)01999-6
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
We studied microscopic chemistry of gaseous phase in GaN growth by computational thermodynamic analysis of metalorganic vapor phase epitaxy with two- and three-flow methods. Correlations between quality of GaN layers and gaseous phase chemistry were found from the computational analysis. It was confirmed that laminar flow, on a substrate during growth was necessary to obtain a high-quality GaN layer in spite of high growth temperature. Optimum decomposed-species V/III ratio (NH2/GaCH3) were considered in the range of 1000-2000 to achieve high electron mobility more than 200 cm(2)/V s. Two-flow method was easier to achieve the optimum condition than three-flow method both in experiments and in computational analysis. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:931 / 935
页数:5
相关论文
共 13 条
[1]   Crystal growth and conductivity control of group III nitride semiconductors and their application to short wavelength light emitters [J].
Akasaki, I ;
Amano, H .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1997, 36 (9A) :5393-5408
[2]   METALORGANIC VAPOR-PHASE EPITAXIAL-GROWTH OF A HIGH-QUALITY GAN FILM USING AN AIN BUFFER LAYER [J].
AMANO, H ;
SAWAKI, N ;
AKASAKI, I ;
TOYODA, Y .
APPLIED PHYSICS LETTERS, 1986, 48 (05) :353-355
[3]   NATIVE DEFECTS IN GALLIUM NITRIDE [J].
BOGUSLAWSKI, P ;
BRIGGS, EL ;
BERNHOLC, J .
PHYSICAL REVIEW B, 1995, 51 (23) :17255-17258
[4]   EQUILIBRIUM PRESSURE OF N-2 OVER GAN AND HIGH-PRESSURE SOLUTION GROWTH OF GAN [J].
KARPINSKI, J ;
JUN, J ;
POROWSKI, S .
JOURNAL OF CRYSTAL GROWTH, 1984, 66 (01) :1-10
[5]   Quantum chemical mechanism in parasitic reaction of AlGaN alloys formation [J].
Makino, O ;
Nakamura, K ;
Tachibana, A ;
Tokunaga, H ;
Akutsu, N ;
Matsumoto, K .
APPLIED SURFACE SCIENCE, 2000, 159 :374-379
[6]   SINGLE-CRYSTAL GALLIUM ARSENIDE ON INSULATING SUBSTRATES [J].
MANASEVIT, HM .
APPLIED PHYSICS LETTERS, 1968, 12 (04) :156-+
[7]   SIMULATION OF CARBON DOPING OF GAAS DURING MOVPE [J].
MASI, M ;
SIMKA, H ;
JENSEN, KF ;
KUECH, TF ;
POTEMSKI, R .
JOURNAL OF CRYSTAL GROWTH, 1992, 124 (1-4) :483-492
[8]  
MASI M, 1993, KAGAKUBINRAN KISOHEN, V2, P350
[9]   The importance of predicting rate-limited growth for accurate modeling of commercial MOCVD reactors [J].
Mazumder, S ;
Lowry, SA .
JOURNAL OF CRYSTAL GROWTH, 2001, 224 (1-2) :165-174
[10]   GROWTH OF GAN BY ECR-ASSISTED MBE [J].
MOUSTAKAS, TD ;
LEI, T ;
MOLNAR, RJ .
PHYSICA B, 1993, 185 (1-4) :36-49