A Monte Carlo simulation study on the structural change of the GaAs(001) surface during MBE growth

被引:42
作者
Ito, T [1 ]
Shiraishi, K [1 ]
机构
[1] NIPPON TELEGRAPH & TEL PUBL CORP, BASIC RES LABS, ATSUGI, KANAGAWA 24301, JAPAN
关键词
adsorption kinetics; computer simulations; epitaxy; gallium arsenide; low index single crystal surfaces; surface structure; morphology; roughness; and topography;
D O I
10.1016/0039-6028(96)00207-5
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A newly developed Monte Carlo (MC) simulation based on the electron counting model called electron counting Monte Carlo (ECMC) simulation, is used to investigate the structural change of the As-stabilized GaAs(001) surface during MBE growth. The calculated results imply that the GaAs(001) surface changes its structure from initial(2 x 4)beta 2 to (2 x 4)alpha with an increase in Ga adatoms and show that subsequent As adsorption produces the (2 x 4)beta 1 structure. Ga adatoms on the GaAs(001)-(2 x 4)beta 1 structure occupy ?he lattice sites on the As-dimers at the low Ga adatom coverage of theta(Ga) less than or equal to 2/16. As the coverage increases in the range of theta(GA) greater than or equal to 3/16, Ga adatoms tend to reside in the lattice sites in the missing dimer region. These results are qualitatively consistent with those obtained by ab initio calculations. Further As incorporation onto the missing dimer row is also simulated by considering the dependence of As adsorption energy on Ga adatom coverage.
引用
收藏
页码:486 / 489
页数:4
相关论文
共 12 条
[1]   ATOMIC-STRUCTURE OF GAAS(100)-(2X1) AND GAAS(100)-(2X4) RECONSTRUCTED SURFACES [J].
CHADI, DJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1987, 5 (04) :834-837
[2]   MOLECULAR-BEAM EPITAXY GROWTH MECHANISMS ON GAAS(100) SURFACES [J].
FARRELL, HH ;
HARBISON, JP ;
PETERSON, LD .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1987, 5 (05) :1482-1489
[3]   STRUCTURES OF AS-RICH GAAS(001)-(2X4) RECONSTRUCTIONS [J].
HASHIZUME, T ;
XUE, QK ;
ZHOU, J ;
ICHIMIYA, A ;
SAKURAI, T .
PHYSICAL REVIEW LETTERS, 1994, 73 (16) :2208-2211
[4]   RECENT PROGRESS IN COMPUTER-AIDED MATERIALS DESIGN FOR COMPOUND SEMICONDUCTORS [J].
ITO, T .
JOURNAL OF APPLIED PHYSICS, 1995, 77 (10) :4845-4886
[5]   SYSTEMATIC-APPROACH TO DEVELOPING EMPIRICAL POTENTIALS FOR COMPOUND SEMICONDUCTORS [J].
ITO, T ;
KHOR, KE ;
DASSARMA, S .
PHYSICAL REVIEW B, 1990, 41 (06) :3893-3896
[6]   ENERGETICS OF GAAS(100)-(2X4) AND GAAS(100)-(4X2) RECONSTRUCTIONS [J].
NORTHRUP, JE ;
FROYEN, S .
PHYSICAL REVIEW LETTERS, 1993, 71 (14) :2276-2279
[7]   STRUCTURE OF GAAS(001) SURFACES - THE ROLE OF ELECTROSTATIC INTERACTIONS [J].
NORTHRUP, JE ;
FROYEN, S .
PHYSICAL REVIEW B, 1994, 50 (03) :2015-2018
[8]   ENERGETICS OF ARSENIC DIMERS ON GAAS(001) AS-RICH SURFACES [J].
OHNO, T .
PHYSICAL REVIEW LETTERS, 1993, 70 (05) :631-634
[9]   STRUCTURE OF GAAS(001) (2X4)-C(2X8) DETERMINED BY SCANNING TUNNELING MICROSCOPY [J].
PASHLEY, MD ;
HABERERN, KW ;
FRIDAY, W ;
WOODALL, JM ;
KIRCHNER, PD .
PHYSICAL REVIEW LETTERS, 1988, 60 (21) :2176-2179
[10]  
SHIRAISHI K, 1995, J CRYST GROWTH, V150, P158, DOI 10.1016/0022-0248(94)00707-1