The structure of monolayer SiO2 on Mo(112):: A 2-D [Si-O-Si] network or isolated [SiO4] units?

被引:35
作者
Chen, Mingshu [1 ]
Goodman, D. Wayne [1 ]
机构
[1] Texas A&M Univ, Dept Chem, College Stn, TX 77843 USA
关键词
infrared reflection-absorption spectroscopy (IRAs); high-resolution electron energy loss spectroscopy (HREELS); scanning tunneling microscopy (STM); surface structure; morphology; silicon dioxide (SiO2);
D O I
10.1016/j.susc.2006.07.024
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
In this letter, atomically resolved scanning tunneling microscopic (STM) images obtained from monolayer SiO2/Mo(112) are presented. The results are consistent with a previously proposed structural model of isolated [SiO4] units based on vibrational features observed by high-resolution electron energy loss spectroscopy (HREELS) and infrared reflection-absorption spectroscopy (IRAS), and oxygen species identified by ultra-violet photoemission spectroscopy (UPS). These results are inconsistent with a structural model that assumes a two-dimensional (2-D) [Si-O-Si] network. These data illustrate that a metal substrate, although coated with an oxide thin layer, can be directly imaged at the atomic-scale with STM. (c) 2006 Elsevier B.V. All rights reserved.
引用
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页码:L255 / L259
页数:5
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