A general model for studying effects of interface layers on thermoelectric devices performance

被引：79

作者：

Xuan, XC

Ng, KC

Yap, C

Chua, HT

机构：

[1] Natl Univ Singapore, Dept Mech Engn, Singapore 119260, Singapore

[2] Natl Univ Singapore, Fac Engn, Bachelor Technol Programme, Singapore 117576, Singapore

来源：

INTERNATIONAL JOURNAL OF HEAT AND MASS TRANSFER | 2002年 / 45卷 / 26期

关键词：

D O I：

10.1016/S0017-9310(02)00217-X

中图分类号：

O414.1 [热力学];

学科分类号：

摘要：

Interface layers play important roles in thermoelectric (TE) devices. The present study employs a phenomenological model to study the effects of internal and/or external interface layers on TE devices performance. Sets of general performance formulae are derived for both TE coolers and generators. Some simplifications are presented, and familiar performance formulae are found by introducing effective or equivalent properties such as electrical resistivity, thermal conductivity and Seebeck coefficient. Moreover, temperature-entropy diagrams are built to understand the effects of interface layers on TE thermodynamic cycles. Together with the power-efficiency curves, TE devices performance can be fully comprehended. In addition, a popular example is analysed, and new results are presented. (C) 2002 Elsevier Science Ltd. All rights reserved.

引用

页码：5159 / 5170

页数：12

共 23 条

[11] Study of interface effects in thermoelectric microrefrigerators [J].