Fabrication of 200 nm period nanomagnet arrays using interference lithography and a negative resist

被引:66
作者
Farhoud, M [1 ]
Ferrera, J [1 ]
Lochtefeld, AJ [1 ]
Murphy, TE [1 ]
Schattenburg, ML [1 ]
Carter, J [1 ]
Ross, CA [1 ]
Smith, HI [1 ]
机构
[1] MIT, Cambridge, MA 02139 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1999年 / 17卷 / 06期
关键词
D O I
10.1116/1.590976
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Magnetic information storage density has increased at the rate of 60% per year for the past seven years. There is wide agreement that continuation of this trend beyond the physical limits of the continuous thin-film media currently used will likely require a transition to discrete, lithographically defined magnetic pillars, Interference lithography (IL) appears to be the most cost-effective means of producing two-dimensional arrays of such pillars. IL can rapidly expose large areas with relatively simple equipment, without the need for a mask, and with fine control of the ratio of pillar diameter to period. We show that negative-tone imaging yields three times the contrast of positive-tone imaging for the generation of holes in photoresist, suitable for subsequent deposition or electroplating of magnetic material. We use a negative i-line, chemically-amplified resist (OHKA THMR-iN PS1) to form 200 nm period arrays of magnetic dots in Co and Ni. Such arrays, with a variety of well controlled diameters, are used to study the effect of particle size on magnetic behavior. (C) 1999 American Vacuum Society [S0734-211X(99)06806-7].
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收藏
页码:3182 / 3185
页数:4
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