Ultrathin fullerene films as high-resolution molecular resists for low-voltage electron-beam lithography

被引:16
作者
Gibbons, Francis P. [1 ]
Robinson, Alex P. G.
Palmer, Richard E.
Manickam, Mayanditheuar
Preece, Jon A.
机构
[1] Univ Birmingham, Sch Phys & Astron, Nanoscale Phys Res Lab, Birmingham B15 2TT, W Midlands, England
[2] Univ Birmingham, Sch Chem, Birmingham B15 2TT, W Midlands, England
基金
英国工程与自然科学研究理事会;
关键词
electron beams; fullerenes; lithography; resists; thin films;
D O I
10.1002/smll.200500443
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The potential use of novel ultrathin fullerene-based materials within the semiconductor industry, which act as high-resolution molecular and resists for low-voltage electron-beam lithography, is analyzed. There are two emerging technologies proposed for next generation lithography, which are arrayed microcolumns and multiple electron-beam. The multiple electron beams are used to create an array of individually controlled beams, while the latter uses a single large beam split by an aperture plate into many concurrently controlled beams. The requirement for high-resolution resists suitable for low energies is becoming increasingly important, as these technologies will most likely operate in the electron-beam energy regime. The fullerene derivative has emerged as a vital ingredient for application in parallel electron-beam lithography systems operating at low energies.
引用
收藏
页码:1003 / 1006
页数:4
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