Transient drain current characteristics of ZnO nanowire field effect transistors

被引:26
作者
Maeng, Jongsun [1 ]
Park, Woojin [1 ]
Choe, Minhyeok [1 ]
Jo, Gunho [1 ]
Kahng, Yung Ho [1 ]
Lee, Takhee [1 ]
机构
[1] Gwangju Inst Sci & Technol, Dept Mat Sci & Engn, Dept Nanobio Mat & Elect, Kwangju 500712, South Korea
关键词
19;
D O I
10.1063/1.3232203
中图分类号
O59 [应用物理学];
学科分类号
摘要
We investigated the characteristics of the time-dependent drain current of ZnO nanowire field effect transistors (FETs). The drain current of ZnO nanowire FETs in ambient air decreases from an initial current level in the microampere range and saturates to the 1-100 nA range in tens of seconds. This transient phenomenon is ascribed to electrically interactive adsorption of oxygen ions to the nanowire surface. Exposure to ambient air during positive gate biasing reduces the conduction channel width by extending the depletion region, resulting in a higher resistivity with conduction only through the narrower nanowire core. (C) 2009 American Institute of Physics. [doi:10.1063/1.3232203]
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页数:3
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共 19 条
[1]   Origin of the slow photoresponse in an individual sol-gel synthesized ZnO nanowire [J].
Ahn, Seung-Eon ;
Ji, Hyun Jin ;
Kim, Kanghyun ;
Kim, Gyu Tae ;
Bae, Chang Hyun ;
Park, Seung Min ;
Kim, Yong-Kwan ;
Ha, Jeong Sook .
APPLIED PHYSICS LETTERS, 2007, 90 (15)
[2]   Carrier relaxation through two-electron process during photoconduction in highly UV sensitive quasi-one-dimensional ZnO nanowires [J].
Bera, A. ;
Basak, D. .
APPLIED PHYSICS LETTERS, 2008, 93 (05)
[3]   Finite size effect in ZnO nanowires [J].
Chang, Pai-Chun ;
Chien, Chung-Jen ;
Stichtenoth, Daniel ;
Ronning, Carsten ;
Lu, Jia Grace .
APPLIED PHYSICS LETTERS, 2007, 90 (11)
[4]   Si/a-Si core/shell nanowires as nonvolatile crossbar switches [J].
Dong, Yajie ;
Yu, Guihua ;
McAlpine, Michael C. ;
Lu, Wei ;
Lieber, Charles M. .
NANO LETTERS, 2008, 8 (02) :386-391
[5]   ZnO nanowire field-effect transistor and oxygen sensing property [J].
Fan, ZY ;
Wang, DW ;
Chang, PC ;
Tseng, WY ;
Lu, JG .
APPLIED PHYSICS LETTERS, 2004, 85 (24) :5923-5925
[6]   Rich Variety of Defects in ZnO via an Attractive Interaction between O Vacancies and Zn Interstitials: Origin of n-Type Doping [J].
Kim, Yong-Sung ;
Park, C. H. .
PHYSICAL REVIEW LETTERS, 2009, 102 (08)
[7]   Piezoelectric Effect on the Electronic Transport Characteristics of ZnO Nanowire Field-Effect Transistors on Bent Flexible Substrates [J].
Kwon, Soon-Shin ;
Hong, Woong-Ki ;
Jo, Gunho ;
Maeng, Jongsun ;
Kim, Tae-Wook ;
Song, Sunghoon ;
Lee, Takhee .
ADVANCED MATERIALS, 2008, 20 (23) :4557-4562
[8]   ZnO/Mg0.2Zn0.8O coaxial nanorod heterostructures for high-performance electronic nanodevice applications [J].
Lee, Chul-Ho ;
Yoo, Jinkyoung ;
Doh, Yong-Joo ;
Yi, Gyu-Chul .
APPLIED PHYSICS LETTERS, 2009, 94 (04)
[9]   Influence of temperature and illumination on surface barrier of individual ZnO nanowires [J].
Liao, Zhi-Min ;
Hou, Chong ;
Zhou, Yang-Bo ;
Xu, Jun ;
Zhang, Jing-Min ;
Yu, Da-Peng .
JOURNAL OF CHEMICAL PHYSICS, 2009, 130 (08)
[10]   Effect of gate bias sweep rate on the electronic properties of ZnO nanowire field-effect transistors under different environments [J].
Maeng, Jongsun ;
Jo, Gunho ;
Kwon, Soon-Shin ;
Song, Sunghoon ;
Seo, Jaeduck ;
Kang, Seok-Ju ;
Kim, Dong-Yu ;
Lee, Takhee .
APPLIED PHYSICS LETTERS, 2008, 92 (23)