共 19 条
Transient drain current characteristics of ZnO nanowire field effect transistors
被引:26
作者:

Maeng, Jongsun
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Gwangju Inst Sci & Technol, Dept Mat Sci & Engn, Dept Nanobio Mat & Elect, Kwangju 500712, South Korea Gwangju Inst Sci & Technol, Dept Mat Sci & Engn, Dept Nanobio Mat & Elect, Kwangju 500712, South Korea

Park, Woojin
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Gwangju Inst Sci & Technol, Dept Mat Sci & Engn, Dept Nanobio Mat & Elect, Kwangju 500712, South Korea Gwangju Inst Sci & Technol, Dept Mat Sci & Engn, Dept Nanobio Mat & Elect, Kwangju 500712, South Korea

Choe, Minhyeok
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Gwangju Inst Sci & Technol, Dept Mat Sci & Engn, Dept Nanobio Mat & Elect, Kwangju 500712, South Korea Gwangju Inst Sci & Technol, Dept Mat Sci & Engn, Dept Nanobio Mat & Elect, Kwangju 500712, South Korea

Jo, Gunho
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Gwangju Inst Sci & Technol, Dept Mat Sci & Engn, Dept Nanobio Mat & Elect, Kwangju 500712, South Korea Gwangju Inst Sci & Technol, Dept Mat Sci & Engn, Dept Nanobio Mat & Elect, Kwangju 500712, South Korea

Kahng, Yung Ho
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Gwangju Inst Sci & Technol, Dept Mat Sci & Engn, Dept Nanobio Mat & Elect, Kwangju 500712, South Korea Gwangju Inst Sci & Technol, Dept Mat Sci & Engn, Dept Nanobio Mat & Elect, Kwangju 500712, South Korea

Lee, Takhee
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Gwangju Inst Sci & Technol, Dept Mat Sci & Engn, Dept Nanobio Mat & Elect, Kwangju 500712, South Korea Gwangju Inst Sci & Technol, Dept Mat Sci & Engn, Dept Nanobio Mat & Elect, Kwangju 500712, South Korea
机构:
[1] Gwangju Inst Sci & Technol, Dept Mat Sci & Engn, Dept Nanobio Mat & Elect, Kwangju 500712, South Korea
关键词:
19;
D O I:
10.1063/1.3232203
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
We investigated the characteristics of the time-dependent drain current of ZnO nanowire field effect transistors (FETs). The drain current of ZnO nanowire FETs in ambient air decreases from an initial current level in the microampere range and saturates to the 1-100 nA range in tens of seconds. This transient phenomenon is ascribed to electrically interactive adsorption of oxygen ions to the nanowire surface. Exposure to ambient air during positive gate biasing reduces the conduction channel width by extending the depletion region, resulting in a higher resistivity with conduction only through the narrower nanowire core. (C) 2009 American Institute of Physics. [doi:10.1063/1.3232203]
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