Excimer laser ablation and etching - Making a mark in many applications

被引:18
作者
Brannon, J
机构
[1] IBM Almaden Research Center, San Jose, CA
来源
IEEE CIRCUITS & DEVICES | 1997年 / 13卷 / 02期
关键词
D O I
10.1109/101.583607
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
[No abstract available]
引用
收藏
页码:11 / 18
页数:8
相关论文
共 25 条
[1]  
ABERGALI D, 1994, LASERS LIFE SCI J, V6, P55
[2]   METAL-FILM REMOVAL AND PATTERNING USING A XECL LASER [J].
ANDREW, JE ;
DYER, PE ;
GREENOUGH, RD ;
KEY, PH .
APPLIED PHYSICS LETTERS, 1983, 43 (11) :1076-1078
[3]  
ASHBY CIH, 1987, PHYS THIN FILMS, V13, P151
[4]  
BASEMAN RJ, 1988, LASER PARTICLE BEAM, V101, P237
[5]  
BRANNON J, 1993, AM VACUUM SOC MONO M, V10
[6]   PULSED LASER STRIPPING OF POLYURETHANE-COATED WIRES - A COMPARISON OF KRF AND CO2-LASERS [J].
BRANNON, JH ;
TAM, AC ;
KURTH, RH .
JOURNAL OF APPLIED PHYSICS, 1991, 70 (07) :3881-3886
[7]   EXCIMER LASER ETCHING OF POLYIMIDE [J].
BRANNON, JH ;
LANKARD, JR ;
BAISE, AI ;
BURNS, F ;
KAUFMAN, J .
JOURNAL OF APPLIED PHYSICS, 1985, 58 (05) :2036-2043
[8]   ULTRAVIOLET PHOTOETCHING OF COPPER [J].
BRANNON, JH ;
BRANNON, KW .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1989, 7 (05) :1275-1283
[9]  
DINGUS RS, 1991, SPIE, V1427, P45
[10]   ENERGY DEPOSITION AT INSULATOR SURFACES BELOW THE ULTRAVIOLET PHOTOABLATION THRESHOLD [J].
DREYFUS, RW ;
MCDONALD, FA ;
VONGUTFELD, RJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1987, 5 (05) :1521-1527