An overview of radiation effects on electronics in the space telecommunications environment

被引:84
作者
Fleetwood, DM
Winokur, PS
Dodd, PE
机构
[1] Vanderbilt Univ, EEC Dept, Nashville, TN 37235 USA
[2] Sandia Natl Labs, Radiat Technol & Assurance Dept, Albuquerque, NM 87185 USA
关键词
D O I
10.1016/S0026-2714(99)00225-5
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Trapped protons and electrons in the Earth's radiation belts and cosmic rays present significant challenges for electronics that must operate reliably in the natural space environment. Single event effects (SEE) can lead to sudden device or system failure, and total dose effects can reduce the lifetime of a space-based telecommunications system. One of the greatest sources of uncertainty in developing radiation requirements for a space system is accounting for the small but finite probability that the system will be exposed to a massive solar particle event, Once specifications are decided, standard laboratory tests are available to predict the total dose response of MOS and bipolar components in space, but SEE testing of components can be more challenging, Prospects are discussed for device modeling, and for the use of commercial electronics in space. In addition: technology trends are discussed for the radiation response of microelectronics in space. (C) 2000 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:17 / 26
页数:10
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