Double focusing of hard x rays using combined multilayer and Bragg-Fresnel optics

被引：7

作者：

Yasa, M

Li, Y ^{[1
]}

Mammen, CB

Als-Nielsen, J

Hoszowska, J

Mocuta, C

Freund, A

机构：

[1] Univ Calif Santa Barbara, Dept Mat, Mat Res Lab, Santa Barbara, CA 93106 USA

[2] Univ Calif Santa Barbara, Dept Phys, Santa Barbara, CA 93106 USA

[3] Univ Copenhagen, Niels Bohr Inst, DK-2100 Copenhagen O, Denmark

[4] European Synchrotron Radiat Facil, F-38043 Grenoble 9, France

来源：

APPLIED PHYSICS LETTERS | 2004年 / 84卷 / 23期

关键词：

D O I：

10.1063/1.1759779

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A multilayer Bragg-Fresnel x-ray lens (MBFL) structure that combines diffraction and geometric focusing on a single device is presented. With the MBFL, the linear BFL focuses the x-ray beam vertically while the bent multilayer focuses x rays horizontally. This combination eliminates the need for a second mirror in the conventional Kirkpatrick-Baez-based microprobe, which will be advantageous in x-ray fluorescence microscopy as well as microdiffraction applications. The characterization of the MBFL was carried out at the European Synchrotron Radiation Facility and a 1.6 mum (vertical)x12 mum (horizontal) focus was obtained from a 250 mum (V)x200 mum (H) incident beam. With a binary Fresnel lens efficiency of about 35% this yields a gain of almost three orders of magnitude compared to obtaining the same spot size by a raw aperture. (C) 2004 American Institute of Physics.

引用

页码：4744 / 4746

页数：3

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